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References
D. Das, S. Collins, Fixed-pattern-noise correction for an integrating wide-dynamic-range CMOS image sensor. IEEE Trans. Electron Devices 60(1), 314–319 (2013)
M. Perenzoni, N. Massari, D. Stoppa, L. Pancheri, M. Malfatti, L. Gonzo, A 160 \(\times \) 120-pixels range camera with in-pixel correlated double sampling and fixed-pattern noise correction. IEEE J. Solid State Circuits 46(7), 1672–1681 (2011)
N. Cottini, M. Gottardi, N. Massari, R. Passerone, Z. Smilansky, A 33-\(\upmu \)W 64 \(\times \) 64 pixel vision sensor embedding robust dynamic background subtraction for event detection and scene interpretation. IEEE J. Solid State Circuits 48(3), 850–863 (2013)
J. Lee, I. Baek, D. Yang, K. Yang, On-Chip FPN calibration for a linear-logarithmic APS using two-step charge transfer. IEEE Trans. Electron Devices 60(6), 1989–1994 (2013)
R. Xu, B. Liu, J. Yuan, A 1500-fps highly sensitive 256 \(\times \) 256 CMOS imaging sensor with in-pixel calibration. IEEE J. Solid State Circuits 6(6), 1408–1418 (2012)
M. Snoeij, A. Theuwissen, K.A.A. Makinwa, J. Huijsing, A CMOS imager with column-level ADC using dynamic column fixed-pattern noise reduction. IEEE J. Solid State Circuits 41(12), 3007–3015 (2006)
S. Kleinfelder, S. Lim, X. Liu, A. El-Gamal, A 10000 frames/s CMOS digital pixel sensor. IEEE J. Solid State Circuits 12(12), 2049–2059 (2001)
M. Sawan, A. Trépanier, J.-L. Trépanier, Y. Audet, R. Ghannoum, A new CMOS multimode digital pixel sensor dedicated to an implantable visual cortical stimulator. J. Analog Integr. Circuits Signal Process. Springer Eng. 49, 187–197 (2006)
A. Bermak, Y.-F. Yung, A DPS array with programmable resolution and reconfigurable conversion time. IEEE Trans. Very Large Scale Integr. Syst. 14(1), 15–22 (2006)
W.W.X. Wang, R. Hornsey, A high dynamic range CMOS image sensor with inpixel light-to-frequency conversion. IEEEE Trans. Electron Devices 53(12), 2988–2992 (2006)
D. Ho, M. Noor, U. Krull, G. Gulak, R. Genov, CMOS tunable-color image sensor with dual-ADC shot-noise-aware dynamic range extension. IEEE Trans. Circuits Syst.-I 60(8), 2116–2129 (2013)
K. Gofrey, Perturbation Signals for System Identification (Prentice Hall, New York, 1993)
B. Dupont, A. Dupret, S. Becker, A. Hamelin, F. Guellec, P. Imperinetti, W. Rabaud, A [10\(^{\circ }\)C; 70\(^{\circ }\)C] 640 \(\times \) 480 17 \({\upmu }\)m pixel pitch TEC-less IR bolometer imager with below 50 mK and below 4V power supply, in Proceedings of the International Solid-State Circuits Conference (IEEE, 2013), pp. 394–396
J. Lv, L. Que, L. Wei, Y. Zhou, B. Liao, Y. Jiang, Uncooled microbolometer infrared focal plane array without substrate temperature stabilization. IEEE Sens. J. 14(5), 1533–1544 (2014)
C.C. Enz, F. Krummenacher, E.A. Vittoz, An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications. J. Analog Integr. Circuits Signal Process. (Kluwer Academic Publishers) 8(1), 83–114 (1995)
R.E. Suarez, P.R. Gray, D.A. Hodges, All-MOS charge redistribution analog-to-digital conversion techniques - Part II. IEEE J. Solid State Circuits 10(6), 379–385 (1975)
S. Ouzounov, E. Roza, J. Hegt, G. van der Weide, A. van Roermund, Analysis and design of high-performance asynchronous sigma-delta modulators with a binary quantizer. IEEE J. Solid State Circuits 41(3), 588–596 (2006)
A. Alvarado, M. Rastogi, J. Harris, J. Principe, The integrate-and-fire sampler: a special type of asynchronous \(\Sigma -\varDelta \) Modulator, in Proceedings of the International Symposium on Circuits and Systems (2011)
M. Peng, H.-S. Lee, Study of substrate noise and techniques for minimization. IEEE J. Solid State Circuits 39(11), 2080–2086 (2004)
A. Bendali, Y. Audet, A 1-V CMOS current reference with temperature and process compensation. IEEE Trans. Circuits Syst.-I 54(7), 1424–1429 (2007)
C. Yoo, J. Park, CMOS current reference with supply and temperature compensation. IET Electron. Lett. 43(25) 1422–1424 (2007)
G.D. Vita, G. Iannacone, A Sub-1V, 10 ppm/\(^{\circ }\)C, nanopower voltage reference generator. IEEE J. Solid State Circuits 42(7), 1536–1542 (2007)
A. Becker-Gomez, T. Lakshmi, T.R. Viswanathan, A low-supply-volatge CMOS sub-bandgap reference. IEEE Trans. Circuits Syst.-II 55(7), 609–613 (2008)
W. Yand, W. Li, R. Liu, Nanopower CMOS sub-bandgap reference with 11ppm/\(^{\circ }\)C temperature coefficient. IET Electron. Lett. 45(12), 63–64 (2009)
K. Ueno, T. Hirose, T. Asai, Y. Amemiya, A 300 nW, 15 ppm/\(\circ \) C, 20 ppm/V CMOS voltage reference circuit consisting of subthreshold MOSFETs. IEEE J. Solid State Circuits 44(7), 2047–2054 (2009)
L. Magnelli, F. Crupi, P. Corsonello, C. Pace, G. Iannaccone, A 2.6 nW, 0.45 V temperature-compensated subthreshold CMOS voltage reference. IEEE J. Solid State Circuits 46(2), 465–474 (2011)
F. Serra-Graells, J.L. Huertas, Sub-1V CMOS proportional-to-absolute-temperature references. IEEE J. Solid State Circuits 38(1), 84–88 (2003)
M.J.M. Pelgrom, A.C.J. Duinmaijer, A.P.G. Welbers, Matching properties of MOS transistors. IEEE J. Solid State Circuits 24(5), 1433–1440 (1989)
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Maria Margarit, J. (2017). Frame-Based Smart IR Imagers. In: Low-Power CMOS Digital Pixel Imagers for High-Speed Uncooled PbSe IR Applications. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-49962-8_2
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