Abstract
Image de-noising is a very important step in Electron Microscopy (EM) image processing, before the three-dimensional reconstruction (tomography reconstruction) of the EM images. They normally have a problem of high noise level, which causes a loss in the contained information. This paper brings out the efficiency of the wavelet transform in the aim of improving the quality of real datasets. These real datasets are an EM images took at different time exposure, meaning reducing the noise level, where it seems better to answer the tradeoff between the use of Low electron doses to reduce the radiation damage, and feasibility to improve SNR after acquisition. In this matter, we have considered both hard and soft thresholding. To assess our results, we have chosen the signal-to-noise-ratio SNR criterion beside the visual quality of the obtained images. As expected, the wavelet was the right choice to perform well in Electron Microscopy and to be efficient in terms of SNR improvement.
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Soumia, S.A., Messali, Z., Ouahabi, A., Marco, S. (2017). Wavelets Based Image De-Noising: Application to EFTEM Imaging. In: Chadli, M., Bououden, S., Zelinka, I. (eds) Recent Advances in Electrical Engineering and Control Applications. ICEECA 2016. Lecture Notes in Electrical Engineering, vol 411. Springer, Cham. https://doi.org/10.1007/978-3-319-48929-2_26
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DOI: https://doi.org/10.1007/978-3-319-48929-2_26
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