Skip to main content

Wavelets Based Image De-Noising: Application to EFTEM Imaging

  • Conference paper
  • First Online:
Recent Advances in Electrical Engineering and Control Applications (ICEECA 2016)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 411))

  • 1230 Accesses

Abstract

Image de-noising is a very important step in Electron Microscopy (EM) image processing, before the three-dimensional reconstruction (tomography reconstruction) of the EM images. They normally have a problem of high noise level, which causes a loss in the contained information. This paper brings out the efficiency of the wavelet transform in the aim of improving the quality of real datasets. These real datasets are an EM images took at different time exposure, meaning reducing the noise level, where it seems better to answer the tradeoff between the use of Low electron doses to reduce the radiation damage, and feasibility to improve SNR after acquisition. In this matter, we have considered both hard and soft thresholding. To assess our results, we have chosen the signal-to-noise-ratio SNR criterion beside the visual quality of the obtained images. As expected, the wavelet was the right choice to perform well in Electron Microscopy and to be efficient in terms of SNR improvement.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Moulin, P., Liu, J.: Analysis of multiresolution image denoising schemes using generalized gaussian and complexity priors. IEEE Inf. Theory 45(3), 909–919 (1999)

    Article  MathSciNet  MATH  Google Scholar 

  2. Strela, V., Portilla, J., Wainwright, M., Simoncelli, E.P.: Image denoising using gaussian scale mixtures in the wavelet domain. In: Proceedings of SPIE 45th Annual Meeting, San Diego, CA, August 2000

    Google Scholar 

  3. Buades, A., Coll, B., Morel, J.M.: A review of image denoising algorithms, with a new one. Simulation 4 (2005)

    Google Scholar 

  4. Chang, S.G., Yu, B., Vetterli, M.: Spatially adaptive wavelet thresholding with context modeling for image denoising. IEEE Trans. Image Process. 9, 1522–1531 (2000)

    Article  MathSciNet  MATH  Google Scholar 

  5. Guo, H., Odegard, J.E., Lang, M., Gopinath, R.A., Selesnick, I.W., Burrus, C.S.: Wavelet based speckle reduction with application to SAR based ATD/R. In: First International Conference on Image Processing, vol. 1, pp. 75–79, November 1994

    Google Scholar 

  6. Wufan, C.: Wavelet Analysis and Its Application on Image Processing. Publishing House of Science, Beijing (2011)

    Google Scholar 

  7. Donoho, D.L., Johnstone, I.M.: Ideal spatial adaptation by wavelet shrinkage. Biometrika 81(3), 425–455 (1994)

    Article  MathSciNet  MATH  Google Scholar 

  8. Donoho, D.L.: De-noising by soft-thresholding. IEEE Trans. Inf. Theory 41(3), 613–627 (1995)

    Article  MathSciNet  MATH  Google Scholar 

  9. Jansen, M., Bulthel, A.: Empirical bayes approach to improve wavelet thresholding for image noise reduction. J. Am. Stat. Assoc. 96(454), 629–639 (2001)

    Article  MathSciNet  MATH  Google Scholar 

  10. Boudjlel, A., Messali, Z., Boubchir, L., Chetih, N.: Non parametric bayesian estimation structure in the wavelet domain of multiple noisy image copies. In: 6th International Conference: Sciences of Electronic, Technologies of Information and Telecommunications SITIS, 21–24 March, Sousse, Tunisia (2012)

    Google Scholar 

  11. Sousa, A.A., Kruhlak, M.J.: Nanoimaging: Methods and Protocols. Springer Protocols. Humana Press, New York (2013)

    Book  Google Scholar 

  12. Hayat, M.A.: Principles and Techniques of Electron Microscopy: Biological Application. Cambridge University Press, Cambridge (2000)

    Google Scholar 

  13. Frank, J.: Electron Tomography. Three-Dimensional Imaging with the Transmission Electron Microscope. Plenum Press, New York (1992)

    Google Scholar 

  14. Marco, S., Boudier, T., Messaoudi, C., Rigaud, J.L.: Electron tomography of biological samples. Biochemistry (Mosc) 69(11), 1219–1225 (2004)

    Article  Google Scholar 

  15. Messaoudi, C., Garreau de Loubresse, N., Boudier, T., Dupuis-Williams, P., Marco, S.: Multiple-axis tomography: applications to basal bodies from Paramecium tetraurelia. Biol. Cell 98, 415–425 (2006)

    Article  Google Scholar 

  16. Boudier, T., Lechaire, J.P., Frebourg, G., Messaoudi, C., Mory, C., Colliex, C., Gaill, F., Marco, S.: A public software for energy filtering transmission electron tomography (EFTET-J): application to the study of granular inclusions in bacteria from Riftia pachyptila. J. Struct. Biol. 151(2), 151–159 (2005)

    Article  Google Scholar 

  17. Messaoudi, C., Boudier, T., Sorzano, C., Marco, S.: TomoJ: tomography software for three-dimensional reconstruction electron microscopy. BMC Bioinform. 6(8), 288 (2007)

    Article  Google Scholar 

  18. http://u759.curie.fr/fr/download/softwares/TomoJ

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Sid Ahemd Soumia .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer International Publishing AG

About this paper

Cite this paper

Soumia, S.A., Messali, Z., Ouahabi, A., Marco, S. (2017). Wavelets Based Image De-Noising: Application to EFTEM Imaging. In: Chadli, M., Bououden, S., Zelinka, I. (eds) Recent Advances in Electrical Engineering and Control Applications. ICEECA 2016. Lecture Notes in Electrical Engineering, vol 411. Springer, Cham. https://doi.org/10.1007/978-3-319-48929-2_26

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-48929-2_26

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-48928-5

  • Online ISBN: 978-3-319-48929-2

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics