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Electromigration Inside Logic Cells

Abstract

EM is a well-known problem and many methods have been proposed to model and to mitigate the EM effects in different design stages, as Sect. 2.1 presents, for different types of interconnections as presented in Sect. 2.2.

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Notes

  1. 1.

    Ampacity is the maximum amount of electrical current a conductor or device can carry before sustaining immediate or progressive deterioration.

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Authors and Affiliations

  1. Instituto de Informática - PPGC/PGMicro, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Rio Grande do Sul, Brazil

    Gracieli Posser & Ricardo Reis

  2. Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA

    Sachin S. Sapatnekar

Authors
  1. Gracieli Posser
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  2. Sachin S. Sapatnekar
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  3. Ricardo Reis
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Posser, G., Sapatnekar, S.S., Reis, R. (2017). State of the Art. In: Electromigration Inside Logic Cells. Springer, Cham. https://doi.org/10.1007/978-3-319-48899-8_2

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  • DOI: https://doi.org/10.1007/978-3-319-48899-8_2

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