Abstract
Electron beams impinging upon solid targets induce the emission of secondary electrons (SE). These are the electrons extracted from the atoms in the solid due to the inelastic electron-atom interaction with electrons of the incident beam or with the other secondary electrons travelling in the solid. Some secondary electrons , after a number of elastic and inelastic interactions with the atoms in the solid, reach the solid surface satisfying the conditions to emerge from it. As we already know, the spectrum of the secondary electrons is contaminated by a contribution of the backscattered primary electrons. As this contamination can be safely neglected in the great majority of the practical situations that investigators encounter in the laboratory experiments, this effect is usually ignored, at least as a first approximation.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
J.P. Ganachaud, A. Mokrani, Surf. Sci. 334, 329 (1995)
M. Dapor, B.J. Inkson, C. Rodenburg, J.M. Rodenburg, Europhys. Lett. 82, 30006 (2008)
J. Ch, Kuhr, H.J. Fitting, J. Electron. Spectrosc. Relat. Phenom. 105, 257 (1999)
M. Dapor, Nucl. Instrum. Methods Phys. Res. B 267, 3055 (2009)
M. Dapor, M. Ciappa, W. Fichtner, J. Micro/Nanolith, MEMS MOEMS 9, 023001 (2010)
Y. Lin, D.C. Joy, Surf. Interface Anal. 37, 895 (2005)
M. Yasuda, K. Morimoto, Y. Kainuma, H. Kawata, Y. Hirai, Jpn. J. Appl. Phys. 47, 4890 (2008)
C.G. Walker, M.M. El-Gomati, A.M.D. Assa’d, M. Zadrazil, Scanning 30, 365 (2008)
M. Dapor, Nucl. Instrum. Methods Phys. Res. B 269, 1668 (2011)
M. Dapor, Prog. Nucl. Sci. Technol. 2, 762 (2011)
G.F. Dionne, J. Appl. Phys. 44, 5361 (1973)
C. Rodenburg, M.A.E. Jepson, E.G.T. Bosch, M. Dapor, Ultramicroscopy 110, 1185 (2010)
M. Ciappa, A. Koschik, M. Dapor, W. Fichtner, Microelectron. Reliab. 50, 1407 (2010)
A. Koschik, M. Ciappa, S. Holzer, M. Dapor, W. Fichtner, Proc. SPIE 7729, 77290X-1 (2010)
R. Shimizu, D. Ze-Jun, Rep. Progr. Phys. 55, 487 (1992)
L. Reimer, U. Golla, R. Bongeler, M. Kassens, B. Schindler, R. Senkel, Fiz. Tverd. Tela Adad. Nauk 1, 277 (1959)
M. Boubaya, G. Blaise, Eur. Phys. J. Appl. Phys. 37, 79 (2007)
L. Reimer, U. Golla, R. Bongeler, M. Kassens, B. Schindler, R. Senkel, Optik (Jena, Ger.) 92, 14 (1992)
É.I. Rau, E.N. Evstaf’eva, M.V. Adrianov, Phys. Solid State 50, 599 (2008)
P.H. Dawson, J. Appl. Phys. 37, 3644 (1966)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer International Publishing AG
About this chapter
Cite this chapter
Dapor, M. (2017). Secondary Electron Yield. In: Transport of Energetic Electrons in Solids. Springer Tracts in Modern Physics, vol 999. Springer, Cham. https://doi.org/10.1007/978-3-319-47492-2_7
Download citation
DOI: https://doi.org/10.1007/978-3-319-47492-2_7
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-47490-8
Online ISBN: 978-3-319-47492-2
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)