Skip to main content
SpringerLink
Log in
SpringerLink
Log in

VNA Calibration Comparison

  • Chapter
  • First Online:
Vector Network Analyzer (VNA) Measurements and Uncertainty Assessment

Part of the book series: PoliTO Springer Series ((PTSS))

  • 1335 Accesses

Abstract

A VNA calibration procedure characterizes and reduces the systematic errors of the instrumentation from the raw measurement data. The measurement accuracy mainly depends on the quality of the VNA calibration. Therefore, the choice of the calibration procedure is very critical. The goal of this chapter is present a comparison of the state of the art 2-port VNA calibration techniques at millimetre frequencies. This comparison will be useful to analyze the efficiency of two different VNA calibration techniques.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 119.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 159.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 159.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Hiebel M, (2007) “Fundamentals of Vector Network Analysis”, 2nd edn, Rohde & Schwarz GmbH & Co., Germany. ISBN 978-3-939837-06-0

    Google Scholar 

  2. Eul HJ, Schiek B (1991) A generalized theory and new calibration procedures for network analyzer self-calibration. IEEE Trans. Microwave Theory Tech. 39(4):724–731

    Article  Google Scholar 

  3. Kruppa W, Sodomsky KF (1971) “An explicit solution for the scattering parameters of a linear two-port measured with an imperfect test set”, IEEE Trans. Microwave Theory Tech., vol. MTT-19(1): 122–123

    Google Scholar 

  4. Rehnmark S (1974) On the calibration process of automatic network analyzer systems. IEEE Trans. Microwave Theory Tech. 22(4):457–458

    Article  Google Scholar 

  5. Engen GF (1974) “Calibration technique for automated network analyzers with application to adapter evaluation”, IEEE Trans. Microwave Theory Tech. MTT-22:1255–1260

    Google Scholar 

  6. Franzen NR, Speciale RA (1975) “A new procedure for System Calibration and error removal in automated Sparameter measurements”. In: Proceedings of the 5th European Microwave Conference (Hamburg) pp 69–73

    Google Scholar 

  7. Fitzpatrick J (1978) Error models for system measurement. Microwave Journal 21:63–66

    MathSciNet  Google Scholar 

  8. Padmanabhan S, Kirby P, Daniel J, Dunleavy L (2003) “Accurate broadband on-wafer SOLT calibrations with complex load and thru models”, In: Proceedings of the 61st ARFTG Microwave Measurements Conference Berlin,Springer, p. 5–10

    Google Scholar 

  9. Blackham D, Wong K (2005) Latest advances in VNA accuracy enhancements. Microwave Journal 48:78–94

    Google Scholar 

  10. Ridler N, Nazoa N (2006) “Using simple calibration load models to improve accuracy of vector network analyser measurements”, In: Proceedings of the 67th ARFTG Microwave Measurements Conference, Springer, Berlin, pp. 104–110

    Google Scholar 

  11. Engen GF, Hoer CA (1978) “The Application of “Thru-Short-Delay” to the Calibration of the Dual Six-Port”, IEEE-MTT-S International Microwave Symposium Digest, pp. 184–185

    Google Scholar 

  12. Engen GF, Hoer CA (1979) “Thru-Load-Delay: An Improved Technique for Calibrating the Dual Six-Port”, IEEE-MTT-S International Microwave Symposium Digest, p 53

    Google Scholar 

  13. Engen GF, Hoer CA (1979) “Thru-reflect-line: An improved technique for calibrating the dual six port automatic network analyzer”, IEEE Trans. Microwave Theory Tech. MTT-27: 987–993

    Google Scholar 

  14. Marks RB (1991) A multiline method of network analyzer calibration. IEEE Trans. Microwave Theory Tech. 39(7):1205–1215

    Article  Google Scholar 

  15. Williams DF, Wang JCM, Arz U (2003) An optimal vector-network-analyzer calibration algorithm. IEEE Trans. Microwave Theory Tech. 51(12):2391–2401

    Article  Google Scholar 

  16. Williams DF, Marks RB, Davidson A (1991) “Comparison of on-wafer calibrations”, In: Proceedings of the 38th ARFTG Microwave Measurements Conference Fall, pp 68–81

    Google Scholar 

  17. Eul HJ, Schiek B (1988) “Thru-match-reflect: One result of a rigorous theory for de-embedding and network analyzer calibration”, In: Proceedings of the 18th European Microwave Conference Stockholm, Sweden, pp 909–914

    Google Scholar 

  18. Soares RA, Gouzien P, Legaud P, Follot G (1989) A unified mathematical approach to two-port calibration techniques and some applications. IEEE Trans. Microwave Theory Tech. 37:1660–1674

    Article  Google Scholar 

  19. Silvonen KI (1991) Calibration of test fixtures using at least two standards. IEEE Trans. Microwave Theory Tech. 39:624–630

    Article  Google Scholar 

  20. Ferrero A, Pisani U (1992) Two-Port Network Analyzer calibration using an unknown thru. IEEE Microwave and Guided Wave Letters 2(12):505–507

    Article  Google Scholar 

  21. Ferrero A, Pisani U (1991) “QSOLT: A new fast calibration algorithm for two port S parameter measurements”, In: Proceedings of the 38th ARFTG Conf. Dig., San Diego, CA, pp 15–24

    Google Scholar 

  22. Eul HJ, Schiek B (1991) Reducing the number of calibration standards for network analyzer calibration. IEEE Trans. Instrum. Meas. 40(4):732–735

    Article  Google Scholar 

  23. Shoaib N (2012) A novel inconsistency condition for 2-port vector network analyzer calibration. Microwave Opt. Technol. Lett. 54(10):2372–2375

    Article  Google Scholar 

  24. Shoaib N, Sellone M, Ferrero A, Oberto L, Brunetti L (2013) “Error propagation with different calibration techniques at millimeter frequencies”, In: Proceedings of the 82nd ARFTG Microwave Measurement Symposium, Columbus, Ohio, USA, pp 1–3

    Google Scholar 

  25. Shoaib N, Sellone M, Oberto L, Brunetti L (2014) “Error propagation with TRL and QSOLT calibration techniques at millimeter frequencies”, INRIM technical report, T.R. 14/2014, pp 1–22

    Google Scholar 

  26. Garelli M, Ferrero A (2012) “A Unified Theory for S-parameter Uncertainty Evaluation”, IEEE Trans. Microwave Theory Tech. 60(12):3844–3855

    Google Scholar 

  27. Stumper U (2005) Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items. IEEE Trans. Instrum. Measure. 54:676–679

    Article  Google Scholar 

  28. Williams D, Wang C (2003) “An optimal multiline TRL calibration algorithm”, MTT-S International Microwave Symposium Digest, pp 1819–1822

    Google Scholar 

  29. Sanpietro F, Ferrero A, Pisani U, Brunetti L (1995) “Accuracy of a multiport vector network analyzer”, IEEE Trans. Instrum. Measure. 44(2):304–307

    Google Scholar 

  30. Martens J, Judge D, Bigelow J (2004) “Uncertainties associated with many-port (4) S-parameter measuremets using a four port vector network analyzer”, IEEE Trans. Microwave Theory Tech. MTT-52(5):1361–1368

    Google Scholar 

  31. Stumper U (2007) Uncertainties of VNA S-parameter measurements applying the TAN self-calibration method. IEEE Trans. Instrum. Measure. 56:597–600

    Article  Google Scholar 

  32. European Association of National Metrology Institutes (EURAMET), “EURAMET cg-12 v.2.0, guidelines on the evaluation of vector network analyzers (VNA)”, March 2011 [Online]. http://www.euramet.org/index.php?id=calibration-guides

  33. Hoffmann J, Leuchtman P, Ruefenacht J, Wong K (2009) “S-parameters of slotted and slotless coaxial connectors”, In: Proceedings of the 74th ARFTG Microwave Measurement Symposium, pp 1–5

    Google Scholar 

  34. Wollensack M (2012) “VNA Tools II: S-parameter uncertainty calculation”, In: Proceedings of the 79th ARFTG Microwave Measurement Conference, p 1–5

    Google Scholar 

  35. BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP and OIML, “JCGM 100:2008, evaluation of measurement data-Guide to the expression of uncertainty in measurement”, International Organization for Standardization (ISO), Sep. 2008 [Online]. http://www.bipm.org/en/publications/guides/gum.html

  36. “HFE High Frequency Engineering Sagl Zona Industriale San Vittore (GR)”, Switzerland [Online]. http://www.HFEmicro.ch

  37. Bellotti R (2013) Rapporto di prova n. 13–0323-01. Tech. Rep, Istituto Nazionale di Ricerca metrologica - INRIM, Torino

    Google Scholar 

  38. Agilent, “Agilent Application Note 1287-11, Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers”, [Online]. http://www.agilent.com

Download references

Author information

Authors and Affiliations

  1. The Petroleum Institute, Abu Dhabi, United Arab Emirates

    Nosherwan Shoaib

Authors
  1. Nosherwan Shoaib
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Nosherwan Shoaib .

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer International Publishing Switzerland

About this chapter

Cite this chapter

Shoaib, N. (2017). VNA Calibration Comparison. In: Vector Network Analyzer (VNA) Measurements and Uncertainty Assessment. PoliTO Springer Series. Springer, Cham. https://doi.org/10.1007/978-3-319-44772-8_3

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-44772-8_3

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-44771-1

  • Online ISBN: 978-3-319-44772-8

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics

Search

Navigation