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Introduction to 3D Microelectronic Packaging

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3D Microelectronic Packaging

Part of the book series: Springer Series in Advanced Microelectronics ((MICROELECTR.,volume 57))

Abstract

Advanced 3D microelectronic packaging technology has been employed to meet portable electronics demand of ultra-thin, ultra-light, high performance with low power consumption. It also opens up a new dimension for the semiconductor industry to maintain Moore’s law with a much lower cost. Motivations as well as various architectures of 3D packaging are illustrated. Challenges in 3D packaging, including fabrication, assembly, cost, design, modeling, thermal management, material, substrate, quality, reliability, and failure analysis, are reviewed with brief introduction to the chapters addressing these challenges.

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References

  1. I. Szendiuch, Radioengineering. 20(1), 214 (2011)

    Google Scholar 

  2. S.F. Al-sarawi, D. Abbott, P.D. Franzon, IEEE Trans. Comp. Packag. Manufact. Technol. 21(1), 2 (1998)

    Article  Google Scholar 

  3. J.Q. Lu, Proc. IEEE 97(1), 18 (2009)

    Article  Google Scholar 

  4. J.H. Lau, Chip Scale Rev. 18(1), 32 (2014)

    Google Scholar 

  5. L. Li, P. Chia, P. Ton, M. Nagar, S. Patil, J. Xue, J. DeLaCruz, M. Voicu, J. Hellings, B. Isaacson, M. Coor, R. Havens, in Conference Proceedings from the 66th Electronic Components and Technology Conference. (ECTC), Las Vegas, 31 May–3 June 2016, p. 1445

    Google Scholar 

  6. C. Lee, C. Hung, C. Cheung, P. Yang, C. Kao, D. Chen, M. Shih, C. C. Chien, Y. Hsiao, L. Chen, M. Su, M. Alfano, J. Siegel, J. Din, B. Black, in Conference Proceedings from the 66th Electronic Components and Technology Conference. (ECTC), Las Vegas, 31 May–3 June 2016, p. 1439

    Google Scholar 

  7. R.R. Tummala, Fundamentals of Microsystems Packaging (McGraw-Hill, New York, 2001), pp. 4–41

    Google Scholar 

  8. D.C. Brock, Understanding Moore’s Law: Four Decades of Innovation (Chemical Heritage Foundation, Philadelphia, 2006), pp. 67–84

    Google Scholar 

  9. Y. Li, P.K. Muthur Srinath, D. Goyal, J. Electron. Mater. 45(1), 116 (2016)

    Article  Google Scholar 

  10. Zhiyong Ma and David G. Seiler, “Metrology and Diagnostic Techniques for Nanoelectronics”, Pan Stanford Publishing, (2016), pp. 1089-1119. (To be published).

    Google Scholar 

  11. T.M. Bauer, S.L. Shinde, J.E. Massad, D.L. Hetherington, in Conference Proceedings from the 59th Electronic Components and Technology Conference. (ECTC), San Diego, 26–29 May 2009, p. 1165

    Google Scholar 

  12. G. Pares, N. Bresson, S. Minoret, V. Lapras, P. Brianceau, J.F. Lugand, R. Anciant, N. Sillon, in Conference Proceedings from the 11th Electronics Packaging Technology Conference (EPTC), Singapore, 9–11 Dec. 2009, p. 772

    Google Scholar 

  13. K-W Lee, H. Hashimoto, M. Onishi, Y. Sato, M. Murugesan, J.-C. Bea, T. Fukushima, T. Tananka, M. Koyanagi, in Conference Proceedings from the 64th Electronic Components and Technology Conference (ECTC), Orlando, 27–30 May 2014, p. 304

    Google Scholar 

  14. A. Eitan, K. Hung, in Conference Proceedings from the 65th Electronic Components and Technology Conference (ECTC), San Diego, 26–29 May 2015, p. 460

    Google Scholar 

  15. K. Zoschke, M. Wegner, M. Wilke, N. Jürgensen, C. Lopper, I. Kuna, V. Glaw, J. Röder1, O. Wünsch1, M.J. Wolf, O. Ehrmann, H. Reichl, in Conference Proceedings from the 60th Electronic Components and Technology Conference (ECTC), Las Vegas, 1–4 June 2010, p. 1385

    Google Scholar 

  16. R. Mahajan, R. Sankman, N. Patel, D. Kim, K. Aygun, Z. Qian, Y. Mekonnen, I. Salama, S. Sharan, D. Iyengar, D. Mallik, in Conference Proceedings from the 66th Electronic Components and Technology Conference (ECTC), Las Vegas, 31 May–3 June 2016, p. 558

    Google Scholar 

  17. C.-H. Liu, J.-L. Tsai, C. Hung-Hsien, C.-L. Lu, S.-C. Chen, in Conference Proceedings from the 64th Electronic Components and Technology Conference (ECTC), Orlando, 27–30 May 2014, p. 1628

    Google Scholar 

  18. C.-H. Liu, Y.-H. Liao, W.-T. Chen, C.-L. Lu, S.-C. Chen, in Conference Proceedings from the 65th Electronic Components and Technology Conference (ECTC), San Diego, 26–29 May 2015, p. 1502

    Google Scholar 

  19. N. Nabiollahi, N. Moelans, M. Gonzalez, J.D. Messemaeker, C.J. Wilson, K. Croes, E. Beyne, I.D. Wolf, Microelectron. Reliab. 55(5), 765–770 (2015)

    Article  Google Scholar 

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Acknowledgement

The editors would like to thank John Elmer from Lawrence Livermore National Laboratory for his critical review of this chapter.

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Correspondence to Yan Li .

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Li, Y., Goyal, D. (2017). Introduction to 3D Microelectronic Packaging. In: Li, Y., Goyal, D. (eds) 3D Microelectronic Packaging. Springer Series in Advanced Microelectronics, vol 57. Springer, Cham. https://doi.org/10.1007/978-3-319-44586-1_1

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  • DOI: https://doi.org/10.1007/978-3-319-44586-1_1

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-44584-7

  • Online ISBN: 978-3-319-44586-1

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