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Temperature and Frequency Dependence of Complex Permittivity in Metal Oxide Dielectrics: Theory, Modelling and Measurement pp 43–67Cite as

Measurement of Dielectric Properties

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Abstract

This chapter reports on the apparatus used to measure the dielectric properties of microwave dielectrics as a function of temperature, consisting of a shielded dielectric resonator mounted upon the cold head of a cryogenic closed-cycle refrigerator.

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Authors and Affiliations

  1. Imperial College London, London, UK

    Jonathan Breeze

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  1. Jonathan Breeze
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Correspondence to Jonathan Breeze .

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Breeze, J. (2016). Measurement of Dielectric Properties. In: Temperature and Frequency Dependence of Complex Permittivity in Metal Oxide Dielectrics: Theory, Modelling and Measurement. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-44547-2_3

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