Abstract
XAFS spectra are measured in several modes such as transmission, fluorescence, and electron yield. Most of XAFS spectra are taken by using synchrotron radiation as an X-ray source, and the system may be set up by beamline scientists. But highly precise measurement is required to obtain reliable experimental results since EXAFS oscillation is very small especially at high k region.
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- 1.
This is to maximize the detection efficiency for the X-rays of interest and minimize it for its higher orders.
- 2.
It is desirable to minimize the solid angle that the ion chambers see the sample so as to minimize the detected intensity of fluorescent X-rays from the reference sample.
- 3.
The value changes with the composition of the fill gas.
- 4.
It is sometimes called as “Lytle detector” according to the developer’s name.
- 5.
It is also called as CRM (Count Rate Meter).
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Nomura, M. (2017). Measurements and Detectors. In: Iwasawa, Y., Asakura, K., Tada, M. (eds) XAFS Techniques for Catalysts, Nanomaterials, and Surfaces. Springer, Cham. https://doi.org/10.1007/978-3-319-43866-5_5
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DOI: https://doi.org/10.1007/978-3-319-43866-5_5
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