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Non-Destructive Internal Lattice Strain Measurement Using High Energy Synchrotron Radiation

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Residual Stress, Thermomechanics & Infrared Imaging, Hybrid Techniques and Inverse Problems, Volume 9

Abstract

High energy synchrotron X-rays can penetrate large samples and real engineering components. Taking advantage of this capability, diffraction techniques using monochromatic X-rays have been widely used to measure the residual strains in engineering components. However, isolating a particular volume inside a large component and measuring the residual strain is a challenge when employing typical monochromatic X-ray techniques. In this work we describe a spiral slit system capable of isolating an interior volume in a polycrystalline sample and non-destructively measuring the lattice strains in the volume. An interference fit sample constructed from a Ni-based superalloy is used to demonstrate the capabilities of the system. We compare the strain results to those measured using a conical slit system, a more mature and established device. The results from several polycrystalline samples with non-cubic crystal symmetry are also presented.

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Acknowledgment

The authors appreciate Dr. V. Honkimäki at the European Synchrotron Radiation Facility, France for loaning the spiral slits. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.

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Correspondence to Jun-Sang Park .

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Park, JS., Okasinski, J. (2017). Non-Destructive Internal Lattice Strain Measurement Using High Energy Synchrotron Radiation. In: Quinn, S., Balandraud, X. (eds) Residual Stress, Thermomechanics & Infrared Imaging, Hybrid Techniques and Inverse Problems, Volume 9. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-42255-8_16

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  • DOI: https://doi.org/10.1007/978-3-319-42255-8_16

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-42254-1

  • Online ISBN: 978-3-319-42255-8

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