Abstract
This book has presented a set of intelligent diagnostic methods to reduce the dependence of board-level diagnosis on time-consuming and ineffective human effort. Multiple machine learning and statistical methods have been studied and adapted for diagnosis. Substantial improvement has been achieved over currently deployed diagnostic software. These solutions are not limited to a particular product; they are generic and can therefore be applied to various products. Although the goal of this book was to advance board-level diagnosis, the core techniques described in this book can also be leveraged for larger electronic systems.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Ye, F., Zhang, Z., Chakrabarty, K., Gu, X. (2017). Conclusions. In: Knowledge-Driven Board-Level Functional Fault Diagnosis. Springer, Cham. https://doi.org/10.1007/978-3-319-40210-9_8
Download citation
DOI: https://doi.org/10.1007/978-3-319-40210-9_8
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-40209-3
Online ISBN: 978-3-319-40210-9
eBook Packages: EngineeringEngineering (R0)