Abstract
Reasoning-based methods have recently become popular since they overcome the knowledge-acquisition bottleneck during volume production and they can automatically generate an intelligent diagnostic system from existing resources [1, 2]. However, knowledge acquisition is a major problem for a reasoning-based method at the initial product ramp-up stage. Machine learning-based reasoning requires an adequate database for training the reasoning engine, and such a database becomes available much later in the product cycle. In this chapter, we propose a knowledge-discovery method and a knowledge-transfer method for facilitating board-level functional fault diagnosis at the initial product ramp-up stage. The proposed methods help address the knowledge gap between test design stage and volume production. First, an analysis technique based on topic model is used to discover knowledge from syndromes, which can be used for training a diagnosis engine. Second, knowledge from diagnosis engines used for earlier-generation products can be automatically transferred through root-cause mapping and syndrome mapping based on keywords and board-structure similarities.
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References
Fenton W, McGinnity T, Maguire L (2001) Fault diagnosis of electronic systems using intelligent techniques: a review. IEEE Trans Syst Man Cybern Part C: Appl Rev 31:269–281
Watson I, Marir F (1994) Case-based reasoning: a review. Knowl Eng Rev 9(4):327–354
Ye F, Zhang Z, Chakrabarty K, Gu X (2013) Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting. IEEE Trans Comput-Aided Des Int Circuits Syst (TCAD) 32(5):723–736
Ye F, Zhang Z, Chakrabarty K, Gu X (2012) “Adaptive board-level functional fault diagnosis using decision trees”. In: Proceedings of the IEEE Asian test symposium (ATS), pp. 202–207
Ye F, Zhang Z, Chakrabarty K, Gu X (2012) “Board-level functional fault diagnosis using learning based on incremental support-vector machines”. In: Proceedings of the IEEE Asian test symposium (ATS), pp. 208–213
Bolchini C, Quintarelli E, Salice F, Garza P (2013) “A data mining approach to incremental adaptive functional diagnosis”, In: Proceedings of the IEEE international symposium on defect and fault tolerance in VLSI systems (DFT), pp. 13–18
Eklow B, Hossein A, Khuong C, Pullela S, Vo T, Chau H (2004) “Simulation based system level fault insertion using co-verification tools”. In: Proceedings of the IEEE international test conference (ITC), pp. 704–710
Manley D, Eklow B, (2002) “A model based automated debug process”. In: Proceedings of the IEEE board test workshop, pp. 1–7
Feret MP, Glasgow JI (1997) Combining case-based and model-based reasoning for the diagnosis of complex devices. Appl Intell 7(1):57–78
Wang L.-C (2013) “Data mining in design and test processes: basic principles and promises”. In: Proceedings of the IEEE international symposium on physical design, pp. 41–42
Klösgen W, Zytkow JM (2002) Handbook of data mining and knowledge discovery. Oxford University Press, Oxford
Steyvers M, Griffiths T (2007) Probabilistic topic models. Handb latent semant anal 427(7):424–440
Pan S, Yang Q (2010) A survey on transfer learning. IEEE Trans Knowl Data Eng 22(10):1345–1359
Hall M, Frank E, Holmes G, Pfahringer B, Reutemann P, Witten IH (2009) The weka data mining software: an update. ACM SIGKDD Explor Newsl 11(1):10–18
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Ye, F., Zhang, Z., Chakrabarty, K., Gu, X. (2017). Knowledge Discovery and Knowledge Transfer. In: Knowledge-Driven Board-Level Functional Fault Diagnosis. Springer, Cham. https://doi.org/10.1007/978-3-319-40210-9_7
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DOI: https://doi.org/10.1007/978-3-319-40210-9_7
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