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Diagnosis Using Support Vector Machines (SVM)

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Knowledge-Driven Board-Level Functional Fault Diagnosis

Abstract

Diagnosis of functional failures at the board level is critical for improving product yield and reducing manufacturing cost. State-of-the-art board-level diagnostic software is unable to cope with high complexity and ever-increasing clock frequencies, and the identification of the root cause of failure on a board is a major problem today. Ambiguous or incorrect repair suggestions lead to long debug times and even wrong repair actions, which significantly increases the repair cost and adversely impacts yield.

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Notes

  1. 1.

    Exact success ratio for the deployed system are not presented here in order to protect company confidential data.

References

  1. Zhang Z, Gu X, Xie Y, Wang Z, Chakrabarty K (2012) Diagnostic system based on support-vector machines for board-level functional diagnosis. In: Proceedings IEEE European test symposium (ETS), pp 1–6

    Google Scholar 

  2. Zhang Z, Chakrabarty K, Wang Z, Wang Z, Gu X (2011) Smart diagnosis: efficient board-level diagnosis and repair using artificial neural networks. In: Proceedings IEEE international test conference (ITC), pp 1–10

    Google Scholar 

  3. O’Farrill C, Moakil-Chbany M, Eklow B (2005) Optimized reasoning-based diagnosis for non-random, board-level, production defects. In: Proceedings IEEE international test conference (ITC), pp 173–179

    Google Scholar 

  4. Zhang Z, Wang Z, Gu X, Chakrabarty K (2010) Board-level fault diagnosis using Bayesian inference. In: Proceedings IEEE VLSI test symposium (VTS), pp 1–6

    Google Scholar 

  5. Vapnik V (1995) The nature of statistical learning theory. Springer, Berlin

    Book  MATH  Google Scholar 

  6. Rakotomamonjy A, Canu S (2008) SVM and Kernel Methods Matlab Toolbox. http://asi.insa-rouen.fr/enseignants/~arakoto/toolbox/index.html

  7. Lanckriet G, De Bie T, Cristianini N, Jordan M, Noble W (2004) A statistical framework for genomic data fusion. Bioinformatics 20:2626–2635

    Article  Google Scholar 

  8. Varma M, Babu BR (2009) More generality in efficient multiple kernel learning. In: Proceedings of ACM international conference on machine learning (ICML), pp 1065–1072

    Google Scholar 

  9. Rakotomamonjy A, Grandvalet Y, Bach F, Canu S (2008) SimpleMKL. J Mach Learn Res 9:2491–2521

    MathSciNet  MATH  Google Scholar 

  10. Chang T, Liu H, Zhou S (2009) Large scale classification with local diversity AdaBoost SVM algorithm. J Syst Eng Electron 20(6):1344–1350

    Google Scholar 

  11. Incremental SVM Learning with multiclass support and probabilistic output (2013) http://www-ti.informatik.uni-tuebingen.de/spueler/mcpIncSVM/

  12. Neural Network Toolbox (2012) http://www.mathworks.com/products/neuralnet/

  13. McLachlan G, Do K, Ambroise C (2004) Analyzing microarray gene expression data, vol 422. Wiley, Hoboken

    Book  MATH  Google Scholar 

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Correspondence to Fangming Ye .

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Ye, F., Zhang, Z., Chakrabarty, K., Gu, X. (2017). Diagnosis Using Support Vector Machines (SVM). In: Knowledge-Driven Board-Level Functional Fault Diagnosis. Springer, Cham. https://doi.org/10.1007/978-3-319-40210-9_2

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  • DOI: https://doi.org/10.1007/978-3-319-40210-9_2

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-40209-3

  • Online ISBN: 978-3-319-40210-9

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