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Introduction

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Soft Error Mechanisms, Modeling and Mitigation

Abstract

With advances in CMOS technology, circuits become increasingly more sensitive to transient pulses caused by Single Event particles. This chapter highlights key terrestrial radiation sources for generation of such transients, soft error generation, circuit level modeling of radiation strikes and, soft error rate calculation.

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Authors and Affiliations

  1. Lamar University, Beaumont, 77710, TX, USA

    Selahattin Sayil

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  1. Selahattin Sayil
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Correspondence to Selahattin Sayil .

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© 2016 Springer International Publishing Switzerland

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Sayil, S. (2016). Introduction. In: Soft Error Mechanisms, Modeling and Mitigation . Springer, Cham. https://doi.org/10.1007/978-3-319-30607-0_1

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  • DOI: https://doi.org/10.1007/978-3-319-30607-0_1

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-30606-3

  • Online ISBN: 978-3-319-30607-0

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