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Hard X-ray Photoelectron Spectroscopy (HAXPES) pp 175–195Cite as

Recoil Effects in X-ray Photoelectron Spectroscopy

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 59))

Abstract

Recent advances in hard X-ray photoelectron spectroscopy (HAXPES) have made it possible to measure electronic energy levels with resolution as high as 80 meV for photon energies extending to as high as 10 keV. For such high energy photoelectrons, the recoil momentum imparted to the atoms is no longer negligible, even though the momentum of the incident photon can safely be neglected. Here, the recoil effects in HAXPES of solids as well as gas-phase molecules are reviewed. It is shown that by comparison of the experimental data with quantum mechanical theories based on appropriate models of matter, information on the local environments of the emitter atoms in the material is obtained.

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Authors and Affiliations

  1. Materials and Structures Laboratory, Tokyo Institute of Technology, Nagatsuta, Yokohama, Japan

    Yosuke Kayanuma

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  1. Yosuke Kayanuma
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Correspondence to Yosuke Kayanuma .

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Editors and Affiliations

  1. Brookhaven National Laboratory, National Institute of Standards and Technology, Upton, New York, USA

    Joseph Woicik

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Kayanuma, Y. (2016). Recoil Effects in X-ray Photoelectron Spectroscopy. In: Woicik, J. (eds) Hard X-ray Photoelectron Spectroscopy (HAXPES). Springer Series in Surface Sciences, vol 59. Springer, Cham. https://doi.org/10.1007/978-3-319-24043-5_8

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