Skip to main content
SpringerLink
Log in
Book cover

Hard X-ray Photoelectron Spectroscopy (HAXPES) pp 111–140Cite as

Inelastic Mean Free Paths, Mean Escape Depths, Information Depths, and Effective Attenuation Lengths for Hard X-ray Photoelectron Spectroscopy

  • Chapter
  • First Online:

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 59))

Abstract

An overview is given of recent work on the determination of inelastic mean free paths, mean escape depths, information depths, and effective attenuation lengths for applications in hard X-ray photoelectron spectroscopy (HAXPES). Sources of data are provided for these parameters and useful predictive equations are given. Information is given on databases available from the National Institute of Standards and Technology (NIST) for HAXPES applications.

This is a preview of subscription content, log in via an institution.

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   229.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   299.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD   299.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. ISO 18115-1, Surface Chemical Analysis—Vocabulary—Part 1. General terms and terms used in spectroscopy, International Organization for Standardization, Geneva (2010); this document can be accessed at http://avs.org/Education-Outreach/Technical-Resources, http://www.emsl.pnl.gov/capabilities/spectroscopy/surface_analysis, and http://www.aist.go.jp/aist_e/aist_laboratories/6metrology/iso.html

  2. W.S.M. Werner, W. Smekal, C.J. Powell, NIST Database for the Simulation of Electron Spectra for Surface Analysis, Version 1.3, Standard Reference Data Program Database 100, U.S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD (2011); http://www.nist.gov/srd/nist100.cfm

  3. W. Smekal, W.S.M. Werner, C.J. Powell, Surf. Interface Anal. 37, 1059 (2005)

    Article  Google Scholar 

  4. C.J. Powell, A. Jablonski, Nucl. Instrum. Methods Phys. Res. A 601, 54 (2009)

    Article  ADS  Google Scholar 

  5. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 43, 689 (2011)

    Article  Google Scholar 

  6. D.R. Penn, Phys. Rev. B 35, 482 (1987)

    Article  ADS  Google Scholar 

  7. S. Tanuma, C.J. Powell, D.R. Penn, J. Electron Spectrosc. Relat. Phenom. 62, 95 (1993)

    Article  Google Scholar 

  8. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 17, 911 (1991)

    Article  Google Scholar 

  9. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 20, 77 (1993)

    Article  Google Scholar 

  10. C.J. Powell, A. Jablonski, J. Phys. Chem. Ref. Data 19, 28 (1999)

    Google Scholar 

  11. H. Bethe, Ann. der Physik 5, 325 (1930)

    Article  ADS  Google Scholar 

  12. M. Inokuti, Rev. Mod. Phys. 43, 297 (1971)

    Article  ADS  Google Scholar 

  13. S.F. Mao, Y.G. Li, R.G. Zeng, Z.J. Ding, J. Appl. Phys. 104, 114907 (2008); erratum 105, 099902 (2009)

    Google Scholar 

  14. S. Tanuma, T. Shiratori, T. Kimura, K. Goto, S. Ichimura, C.J. Powell, Surf. Interface Anal. 37, 833 (2005)

    Article  Google Scholar 

  15. W.S.M. Werner, C. Tomastik, T. Cabela, G. Richter, H. Störi, Surf. Sci. 470, L123 (2000)

    Article  Google Scholar 

  16. W.S.M. Werner, C. Tomastik, T. Cabela, G. Richter, H. Störi, J. Electron Spectrosc. Relat. Phenom. 113, 127 (2001)

    Article  Google Scholar 

  17. W.S.M. Werner, K. Glantschnig, C. Ambrosch-Draxl, J. Phys. Chem. Ref. Data 38, 1013 (2009)

    Article  ADS  Google Scholar 

  18. N.D. Mermin, Phys. Rev. B 1, 2362 (1970)

    Article  ADS  Google Scholar 

  19. J.D. Bourke, C.T. Chantler, J. Phys. Chem. A 116, 3202 (2012)

    Article  Google Scholar 

  20. J.D. Bourke, C.T. Chantler, Phys. Rev. Lett. 104, 206601 (2010)

    Article  ADS  Google Scholar 

  21. C.T. Chantler, J.D. Bourke, J. Phys. Chem. Lett. 1, 2422 (2010)

    Article  Google Scholar 

  22. B. Da, H. Shinotsuka, H. Yoshikawa, Z.J. Ding, S. Tanuma, Phys. Rev. Lett. 113, 063201 (2014)

    Article  ADS  Google Scholar 

  23. S. Tanuma et al. (to be published)

    Google Scholar 

  24. http://www.wien2k.at

  25. http://www.feffproject.org

  26. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 21, 165 (1994)

    Article  Google Scholar 

  27. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 37, 1 (2005)

    Article  Google Scholar 

  28. M.P. Seah, Surf. Interface Anal. 44, 497 (2012)

    Article  Google Scholar 

  29. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 17, 929 (1991)

    Google Scholar 

  30. A. Jablonski, C.J. Powell, J. Vac. Sci. Technol. A 27, 253 (2009)

    Article  Google Scholar 

  31. C.J. Powell, A. Jablonski, NIST Electron Effective-Attenuation-Length Database, Version 1.3, Standard Reference Data Program Database 82, U.S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD (2011); http://www.nist.gov/srd/nist82.cfm

  32. S. Tanuma, H. Yoshikawa, H. Shinotsuka, R. Ueda, J. Electron Spectrosc. Relat. Phenom. 190, 127 (2013)

    Article  Google Scholar 

  33. A. Jablonski, C.J. Powell, Surf. Sci. Rep. 47, 33 (2002)

    Article  ADS  Google Scholar 

  34. C.J. Powell, A. Jablonski, Surf. Interface Anal. 33, 211 (2002)

    Article  Google Scholar 

  35. A. Jablonski, C.J. Powell, J. Electron Spectrosc. Relat. Phenom. 199, 27 (2015)

    Article  Google Scholar 

  36. M.P. Seah, Surf. Interface Anal. 44, 1353 (2012)

    Article  Google Scholar 

  37. C.J. Powell, W.S.M. Werner, W. Smekal, Surf. Interface Anal. 45, 628 (2013)

    Article  Google Scholar 

  38. G. Tasneem, C. Tomastik, S. Gerhold, W.S.M. Werner, W. Smekal, C.J. Powell, Surf. Interface Anal. 43, 934 (2010)

    Article  Google Scholar 

  39. R. Champaneria, P. Mack, R. White, J. Wolstenholme, Surf. Interface Anal. 35, 1028 (2003)

    Article  Google Scholar 

  40. Certain commercial products are identified to specify the experimental conditions. This identification does not imply that the products are endorsed or recommended by the National Institute of Standards and Technology, or that they are necessarily the most suitable for the purposes described

    Google Scholar 

  41. M.P. Seah, R. White, Surf. Interface Anal. 33, 960 (2002)

    Article  Google Scholar 

  42. K.J. Kim, M.P. Seah, Surf. Interface Anal. 39, 512 (2007)

    Article  Google Scholar 

  43. C.J. Powell, W.S.M. Werner, W. Smekal, Appl. Phys. Lett. 89, 252116 (2006)

    Article  ADS  Google Scholar 

  44. N. Pauly, S. Tougaard, Surf. Sci. 605, 1556 (2011)

    Article  ADS  Google Scholar 

  45. O.A. Baschenko, V.I. Nefedov, J. Electron Spectrosc. Relat. Phenom. 27, 109 (1982)

    Article  Google Scholar 

  46. C. Dallera, L. Duo, G. Panaccione, G. Paolicelli, B. Cowie, J. zegenhagen, and L. Braicovich, Appl. Phys. Lett. 85, 4532 (2004)

    Google Scholar 

  47. M. Sacchi, F. Offi, P. Torelli, A. Fondacaro, C. Spezzani, M. Cautero, G. Cautero, S. Huotari, M. Grioni, R. Delaunay, M. Fabrizioli, G. Vanko, G. Monaco, G. Paolicelli, G. Stefani, G. Panaccione, Phys. Rev. B 71, 155117 (2005)

    Article  ADS  Google Scholar 

  48. A.X. Gray, A. Janotti, J. Son, J.M. LeBeau, S. Ueda, Y. Yamashita, K. Kobayashi, A.M. Kaiser, R. Sutarto, H. Wadati, G.A. Sawatzky, C.G. Van de Walle, S. Stemmer, C.S. Fadley, Phys. Rev. B 84, 075104 (2011)

    Article  ADS  Google Scholar 

  49. J. Rubio-Zuazo, G.R. Castro, J. Electron Spectrosc. Relat. Phenom. 184, 384 (2011)

    Article  Google Scholar 

  50. C.J. Powell, W.S.M. Werner, W. Smekal (to be published)

    Google Scholar 

  51. A.V. Naumkin, A. Kraut-Vass, S.W. Gaarenstroom, C.J. Powell, NIST X-ray Photoelectron Spectroscopy Database, Version 4.1, Standard Reference Data Program Database 64, U.S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD (2012); http://srdata.nist.gov/xps

  52. C.J. Powell, J. Electron Spectrosc. Relat. Phenom. 185, 1 (2012)

    Article  Google Scholar 

  53. F. Salvat, A. Jablonski, C.J. Powell, NIST Electron Elastic-Scattering Cross-Section Database, Version 3.2, Standard Reference Data Program Database 64, U.S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD (2010); http://www.nist.gov/srd/nist64.cfm

  54. A. Jablonski, F. Salvat, C.J. Powell, J. Phys. Chem. Ref. Data 33, 409 (2004)

    Article  ADS  Google Scholar 

  55. C.J. Powell, A. Jablonski, NIST Electron Inelastic-Mean-Free-Path Database, Version 1.2, Standard Reference Data Program Database 71, U.S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD (2010); http://www.nist.gov/srd/nist71.cfm

  56. W.H. Gries, Surf. Interface Anal. 24, 38 (1996)

    Article  Google Scholar 

  57. W.S.M. Werner, W. Smekal, T. Hisch, J. Himmelsbach, C.J. Powell, J. Electron Spectrosc. Relat. Phenom. 190, 137 (2013)

    Article  Google Scholar 

  58. C.J. Powell, W.S.M. Werner, W. Smekal, J. Vac. Sci. Technol. A 32, 050603 (2014)

    Article  Google Scholar 

  59. A.G. Shard, Surf. Interface Anal. 46, 175 (2014)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899-8370, USA

    C. J. Powell

  2. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Ibaraki, Japan

    S. Tanuma

Authors
  1. C. J. Powell
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. S. Tanuma
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to C. J. Powell .

Editor information

Editors and Affiliations

  1. Brookhaven National Laboratory, National Institute of Standards and Technology, Upton, New York, USA

    Joseph Woicik

Rights and permissions

Reprints and permissions

Copyright information

© 2016 Springer International Publishing Switzerland

About this chapter

Cite this chapter

Powell, C.J., Tanuma, S. (2016). Inelastic Mean Free Paths, Mean Escape Depths, Information Depths, and Effective Attenuation Lengths for Hard X-ray Photoelectron Spectroscopy. In: Woicik, J. (eds) Hard X-ray Photoelectron Spectroscopy (HAXPES). Springer Series in Surface Sciences, vol 59. Springer, Cham. https://doi.org/10.1007/978-3-319-24043-5_5

Download citation

Publish with us

Policies and ethics

Search

Navigation