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Femtosecond Time-Resolved HAXPES

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Hard X-ray Photoelectron Spectroscopy (HAXPES)

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 59))

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Abstract

The problems, progress, and prospects of time-resolved hard X-ray photoelectron spectroscopy (TR-HAXPES) using X-ray free-electron laser (XFEL) radiation are discussed. This novel photoemission technique is characterized by a unique combination of femtosecond time resolution and bulk sensitivity with momentum selectivity and sensitivity to the atomic site-specific chemical and structural environment. TR-HAXPES will in particular enable us to simultaneously study the ultrafast electron and structural dynamics in the bulk of complex materials and electronic devices.

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Notes

  1. 1.

    FEL seeding is a technique in which the FEL is not operated in the SASE mode (amplifying the shot noise in the electron beam), but is instead used as an amplifier that is seeded by coherent radiation from another laser source, e.g., an optical laser, a higher harmonic source, or even a second SASE FEL.

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Acknowledgments

The authors thank the operation and engineering staff of SACLA for their support during the TR-HAXPES experiments. The experiments were performed with the approval of JASRI (proposal nos. 2013A8050 and 2013A8067).

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Authors and Affiliations

  1. Institute of Experimental and Applied Physics, University of Kiel, 24098, Kiel, Germany

    Lars-Philip Oloff & Kai Rossnagel

  2. RIKEN Spring-8 Center, Sayo-Cho, Hyogo, 679-5148, Japan

    Lars-Philip Oloff, Masaki Oura, Ashish Chainani & Kai Rossnagel

Authors
  1. Lars-Philip Oloff
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  2. Masaki Oura
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  3. Ashish Chainani
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  4. Kai Rossnagel
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Corresponding author

Correspondence to Kai Rossnagel .

Editor information

Editors and Affiliations

  1. Brookhaven National Laboratory, National Institute of Standards and Technology, Upton, New York, USA

    Joseph Woicik

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Oloff, LP., Oura, M., Chainani, A., Rossnagel, K. (2016). Femtosecond Time-Resolved HAXPES. In: Woicik, J. (eds) Hard X-ray Photoelectron Spectroscopy (HAXPES). Springer Series in Surface Sciences, vol 59. Springer, Cham. https://doi.org/10.1007/978-3-319-24043-5_20

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