Skip to main content

Metallography Applied to Spacecraft Test Failures

  • Chapter
  • First Online:
Materials and Processes

Part of the book series: Springer Praxis Books ((ASTROENG))

  • 4374 Accesses

Abstract

The failure mode of spacecraft materials can often be assessed by detailed examination of the fracture surfaces. The scanning electron microscope (SEM) is an invaluable tool in such failure investigations because it extends both the depth of field and the magnifications obtainable by conventional light microscopes.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 219.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 279.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 279.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Notes

  1. 1.

    1 Å (angstrom unit) = 10−10 m.

  2. 2.

    The solar absorptance to solar emittance ration, α/ε, for polished steel is 0.5/0.13 = 3.88.

  3. 3.

    For aluminized FEP Teflon, the α/ε ratio is 0.1/0.8 = 0.12.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Barrie D. Dunn .

Rights and permissions

Reprints and permissions

Copyright information

© 2016 Springer International Publishing Switzerland

About this chapter

Cite this chapter

Dunn, B.D. (2016). Metallography Applied to Spacecraft Test Failures. In: Materials and Processes. Springer Praxis Books(). Springer, Cham. https://doi.org/10.1007/978-3-319-23362-8_5

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-23362-8_5

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-23361-1

  • Online ISBN: 978-3-319-23362-8

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics