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Abstract

Neutron Reflectometry (NR) is capable to determine the chemical depth profile of thin film samples from the sub-nanometer regime up to about 200 nm thickness. The high sensitivity of neutrons to hydrogen and deuterium enables NR to detect absolute hydrogen concentrations in the at.% range even in nm-thick layers. Therefore, NR is an ideal tool to study in-situ the hydrogen/deuterium absorption and desorption properties of thin films on a nanometer scale—without the need of a calibration sample. After an introduction to the NR technique and required instrumentation, this chapter provides a comprehensive overview of NR applications in various scientific areas, e.g. hydrogen absorption and desorption of Mg-based alloys and thin Nb films, electrochemical measurements on thin Zr and Ti films, and tuning of the oscillating magnetic exchange coupling in Fe/V and Fe/Nb multilayers with hydrogen.

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Fritzsche, H., Klose, F., Rehm, C., Tun, Z., Wolff, M., Hjörvarsson, B. (2016). Neutron Reflectometry. In: Fritzsche, H., Huot, J., Fruchart, D. (eds) Neutron Scattering and Other Nuclear Techniques for Hydrogen in Materials. Neutron Scattering Applications and Techniques. Springer, Cham. https://doi.org/10.1007/978-3-319-22792-4_5

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