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The Impact of Sensitive Inputs on the Reliability of Nanoscale Circuits

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Abstract

As CMOS technology scales to nanometer dimensions, its performance and behavior become less predictable. Reliability studies for nanocircuits and systems become important when the circuit’s outputs are affected by its sensitive noisy inputs. In conventional circuits, the impact of the inputs on reliability can be observed by the deterministic input patterns. However, in nanoscale circuits, the inputs behave probabilistically. The Bayesian networks technique is used to compute the reliability of a circuit in conjunction with the Monte Carlo simulations approach which is applied to model the probabilistic inputs and ultimately to determine sensitive inputs and worst-case input combinations.

Keywords

Input Sensitivity Nanoscale Circuits Input Combinations Deterministic Input Nanocircuits 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer International Publishing Switzerland 2015

Authors and Affiliations

  1. 1.Universiti Teknologi PetronasTeronohMalaysia
  2. 2.University of PaderbornPaderbornGermany

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