Mechanism of Electron Radiation Induced Loss of the “Panda” Type Polarization-Maintaining Optical Fibers
Evolution and mechanism of the induced loss of the 1310 nm working-wavelength “Panda” type quartz PM fiber irradiated by the 1 MeV and 170 keV electrons respectively were experimentally investigated using electron accelerator. The results show that, fiber loss exhibits an exponential increase with increasing radiation fluence, which is higher under low-energy electrons than under high-energy electrons. The irradiated quartz fibers show an annealing effect. The restored loss of the fiber irradiated by high-energy electron is higher than that by low-energy electron. The radiation induced loss of quartz fiber has two mechanisms of Si–OH absorption and H2 absorption. Under lower electron energy, the energy deposition of fiber core is in majority leading to more radiation defects forming while the loss is mainly controlled by Si–OH. In the case of the fiber subjected to high-energy electron radiation, the absorbed dose of fiber core is relatively low, which is dominated by H2 absorption. Hydrogen that is involved in both mechanisms is generated by radiation induced degradation of polymer coating and diffuses into fiber core.
KeywordsPolarization-maintaining optical fiber Radiation effect Induced optical loss Infrared absorption Si–OH defect
- 1.Friebele EJ, Askins CG, Miller GA (2004) Optical fiber sensors for spacecraft: applications and challenges. The International Society for Optical Engineering, Denver, CO, pp 120–131Google Scholar