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Analyzing Variability of Cloned Artifacts: Formal Framework and Its Application to Requirements

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Enterprise, Business-Process and Information Systems Modeling (BPMDS 2015, EMMSAD 2015)

Part of the book series: Lecture Notes in Business Information Processing ((LNBIP,volume 214))

Abstract

Software Product Line Engineering (SPLE) promotes systematic reuse through variability mechanisms, such as configuration, parameterization, and inheritance. In reality, however, such reuse is many times done ad-hoc, resulting in several clones of the same product artifact which need to be managed in all development stages. To address this need, we provide in this paper a formal framework to represent dimensions of variability, which can be applied for identifying and analyzing variability automatically. The framework is based on the assumption that software artifacts can be modeled as graphs, and variability can be analyzed through examining the properties of mappings between the elements of these graphs. We demonstrate the potential usefulness of our framework by applying it to identify and analyze variability of functional requirements written in a natural language.

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References

  1. Anastasopoules, M., Gacek, C.: Implementing product line variabilities. In: Proceedings of the 2001 Symposium on Software Reusability: Putting Software Reuse in Context, SSR 2001, pp. 109–117 (2001)

    Google Scholar 

  2. Arieli, O., Denecker, M., Bruynooghe, M.: Distance semantics for database repair. Annals of Mathematics and Artificial Intelligence 50(3–4), 389–415 (2007)

    Article  Google Scholar 

  3. Becker, J., Delfmann, P., Knackstedt, R.: Adaptive Reference modeling: integrating configurative and generic adaptation techniques for information models. In: Becker, J., Delfmann, P. (eds.) Reference Modeling – Efficient Information Systems Design Through Reuse of Information Models. Physica-Verlag HD, pp. 27–58 (2006)

    Google Scholar 

  4. Berger, T., Rublack, R., Nair, D., Atlee, J.M., Becker, M., Czarnecki, K., Wasowski, A.: A survey of variability modeling in industrial practice. In: Proceedings of the 7th International Workshop on Variability Modelling of Software-Intensive Systems, VaMoS 2013, pp. 7:1–7:8 (2013)

    Google Scholar 

  5. Dannenberg, R.B., Verslype, K., Greefhorst, D., Kuusela, J., Obbink, H., Pohl, K.: Variability issues in software product lines. In: van der Linden, F.J. (ed.) PFE 2002. LNCS, vol. 2290, pp. 13–21. Springer, Heidelberg (2002)

    Chapter  Google Scholar 

  6. Chen, K., Zhang, W., Zhao, H., Mei, H.: An approach to constructing feature models based on requirements clustering. In: Proceedings of the 13th IEEE International Conference on Requirements Engineering, RE 2005, pp. 31–40 (2005)‏

    Google Scholar 

  7. Chen, L., Ali Babar, M., Ali, N.: Variability management in software product lines: a systematic review. In: Proceedings of the 13th International Software Product Line Conference, SPLC 2009, pp. 81–90 (2009)

    Google Scholar 

  8. Clements, P., Northrop, L.: Software Product Lines: Practices and Patterns. Addison-Wesley (2001)

    Google Scholar 

  9. Faust, D., Verhoef, C.: Software Product Line Migration and Deployment. Journal of Software Practice and Experiences 30(10), 933–955 (2003)

    Article  Google Scholar 

  10. Gildea, D., Jurafsky, D.: Automatic Labeling of Semantic Roles. Computational Linguistics 28(3), 245–288 (2002)

    Article  Google Scholar 

  11. Heymans, P., Schobbens, P.Y., Trigaux, J.C., Bontemps, Y., Matulevicius, R., Classen, A.: Evaluating formal properties of feature diagram languages. IET Software 2(3), 281–302 (2008)

    Article  Google Scholar 

  12. Uslar, M., Specht, M., Rohjans, S., Trefke, J., Gonzalez, J.M.V.: Perspective. In: Uslar, M., Specht, M., Rohjans, S., Trefke, J., Vasquez Gonzalez, J.M. (eds.) The Common Information Model CIM. POWSYS, vol. 2, pp. 189–196. Springer, Heidelberg (2012)

    Chapter  Google Scholar 

  13. Jacobson, I., Griss, M., Jonsson, P.: Software Reuse: Architecture, Process, and Organization for Business Success. Addison-Wesley Longman, Reading, MA (1997)

    Google Scholar 

  14. Jaring, M., Dannenberg, R.B.: Representing variability in software product lines: a case study. In: Chastek, G.J. (ed.) SPLC 2002. LNCS, vol. 2379, pp. 15–36. Springer, Heidelberg (2002)

    Chapter  Google Scholar 

  15. Kurita, T.: An efficient agglomerative clustering algorithm using a heap. Pattern Recognition 24(3), 205–209 (1991)

    Article  Google Scholar 

  16. Landauer, T.K., Foltz, P.W., Laham, D.: Introduction to Latent Semantic Analysis. Discourse Processes 25, 259–284 (1998)

    Article  Google Scholar 

  17. Mani, I., Verhagen, M., Wellner, B., Lee, C.M., Pustejovsky, J.: Machine learning of temporal relations. In: The 21st International Conference on Computational Linguistics and the 44th Annual Meeting of the Association for Computational Linguistics, pp. 753–760 (2006)

    Google Scholar 

  18. Mende, T., Koschke, R., Beckwermert, F.: An Evaluation of Code Similarity Identification for the Grow-and-Prune Model. Journal of Software Maintenance and Evolution 21(2), 143–169 (2009)

    Article  Google Scholar 

  19. Mihalcea, R., Corley, C., Strapparava, C.: Corpus-based and knowledge-based measures of text semantic similarity. In: The 21st National Conference on Artificial intelligence, AAAI 2006, vol. 1, pp. 775–780 (2006)

    Google Scholar 

  20. Niu, N., Easterbrook, S.: Extracting and modeling product line functional requirements. In: The 16th IEEE International Requirements Engineering Conference, RE 2008, pp. 155–164 (2008)

    Google Scholar 

  21. Pohl, K., Böckle, G., van der Linden, F.: Software Product-line Engineering: Foundations, Principles, and Techniques. Springer, Heidelberg (2005)

    Book  Google Scholar 

  22. Raghunathan, K., Lee, H., Rangarajan, S., Chambers, N., Surdeanu, M., Jurafsky, D., Manning, C.: A multi-pass sieve for coreference resolution. In: The Conference on Empirical Methods in Natural Language Processing, EMNLP 2010, pp. 492–501 (2010)

    Google Scholar 

  23. Reinhartz-Berger, I., Itzik, N., Wand, Y.: Analyzing variability of software product lines using semantic and ontological considerations. In: Jarke, M., Mylopoulos, J., Quix, C., Rolland, C., Manolopoulos, Y., Mouratidis, H., Horkoff, J. (eds.) CAiSE 2014. LNCS, vol. 8484, pp. 150–164. Springer, Heidelberg (2014)

    Chapter  Google Scholar 

  24. Rubin, J., Czarnecki, K., Chechik, M.: Managing cloned variants: a framework and experience. In: Proceedings of the 17th International Software Product Line Conference, SPLC 2013, pp. 101–110 (2013)

    Google Scholar 

  25. Ryssel, U., Ploennigs, J., Kabitzsch, K.: Automatic variation-point identification in function-block-based models. In: Proceedings of GPCE 2010, pp. 23–32 (2010)

    Google Scholar 

  26. Schnieders, A., Puhlmann, F.: Variability mechanisms in e-business process families. In: International Conference on Business Information Systems, BIS 2006 (2006)

    Google Scholar 

  27. Weston, N., Chitchyan, R., Rashid, A.: A framework for constructing semantically composable feature models from natural language requirements. In: Proceedings of the 13th International Software Product Line Conference, SPLC 2009, pp. 211–220 (2009)

    Google Scholar 

  28. Yoshimura, K., Narisawa, F., Hashimoto, K., Kikuno, T.: FAVE: factor analysis based approach for detecting product line variability from change history. In: Proceedings of MSR 2008, pp. 11–18 (2008)

    Google Scholar 

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Authors and Affiliations

  1. Department of Information Systems, University of Haifa, Haifa, Israel

    Iris Reinhartz-Berger, Anna Zamansky & Mark Kemelman

Authors
  1. Iris Reinhartz-Berger
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  2. Anna Zamansky
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  3. Mark Kemelman
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Corresponding author

Correspondence to Anna Zamansky .

Editor information

Editors and Affiliations

  1. Luxembourg Institute of Science & Technology, Luxembourg, Luxembourg

    Khaled Gaaloul

  2. Munich University of Applied Sciences, Munich, Germany

    Rainer Schmidt

  3. Université Paris 1 Panthéon – Sorbonne, Paris, France

    Selmin Nurcan

  4. Lusofona University, Lisbon, Portugal

    Sérgio Guerreiro

  5. Luxembourg Institute of Science & Technology, Luxembourg, Luxembourg

    Qin Ma

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Reinhartz-Berger, I., Zamansky, A., Kemelman, M. (2015). Analyzing Variability of Cloned Artifacts: Formal Framework and Its Application to Requirements. In: Gaaloul, K., Schmidt, R., Nurcan, S., Guerreiro, S., Ma, Q. (eds) Enterprise, Business-Process and Information Systems Modeling. BPMDS EMMSAD 2015 2015. Lecture Notes in Business Information Processing, vol 214. Springer, Cham. https://doi.org/10.1007/978-3-319-19237-6_20

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  • DOI: https://doi.org/10.1007/978-3-319-19237-6_20

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-19236-9

  • Online ISBN: 978-3-319-19237-6

  • eBook Packages: Computer ScienceComputer Science (R0)

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