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Electron Microscopy Study of Thermoelectric (BixSb1-x)2Te3 Thin Film

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2nd International Multidisciplinary Microscopy and Microanalysis Congress

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 164))

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Abstract

In the present work, transmission electron microscopy (TEM) techniques were used in order to study the morphology and investigate the structural properties of a (BixSb1-x)2Te3 (BST) thin film. The sample was fabricated on silicon substrate by pulsed laser deposition (PLD) method. Towards this aim, cross sectional and planar view samples were prepared, suitable for High Resolution Electron Microscopy. Results revealed a polycrystalline, c-axis oriented film with coherent boundaries between neighboring columnar grains.

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Author information

Authors and Affiliations

  1. Department of Physics, Aristotle University of Thessaloniki, 54124, Thessaloniki, Greece

    Aikaterini Breza & Christos B. Lioutas

  2. Department of Mechanical Engineering, University of Cyprus, 75 Kallipoleos Avenue, PO Box 20537, 1678, Nicosia, Cyprus

    John Giapintzakis

Authors
  1. Aikaterini Breza
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  2. Christos B. Lioutas
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  3. John Giapintzakis
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Corresponding author

Correspondence to Christos B. Lioutas .

Editor information

Editors and Affiliations

  1. Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece

    E.K. Polychroniadis

  2. Department of Materials Science and Engineering, Gebze Technical University, Gebze, Kocaeli, Turkey

    Ahmet Yavuz Oral

  3. Department of Physics, Istanbul Kultur University, Istanbul, Bakirkoy, Turkey

    Mehmet Ozer

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Breza, A., Lioutas, C.B., Giapintzakis, J. (2015). Electron Microscopy Study of Thermoelectric (BixSb1-x)2Te3 Thin Film. In: Polychroniadis, E., Oral, A., Ozer, M. (eds) 2nd International Multidisciplinary Microscopy and Microanalysis Congress. Springer Proceedings in Physics, vol 164. Springer, Cham. https://doi.org/10.1007/978-3-319-16919-4_1

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