Skip to main content

Interest Points via Maximal Self-Dissimilarities

  • Conference paper
  • First Online:
Computer Vision -- ACCV 2014 (ACCV 2014)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 9004))

Included in the following conference series:

Abstract

We propose a novel interest point detector stemming from the intuition that image patches which are highly dissimilar over a relatively large extent of their surroundings hold the property of being repeatable and distinctive. This concept of contextual self-dissimilarity reverses the key paradigm of recent successful techniques such as the Local Self-Similarity descriptor and the Non-Local Means filter, which build upon the presence of similar - rather than dissimilar - patches. Moreover, our approach extends to contextual information the local self-dissimilarity notion embedded in established detectors of corner-like interest points, thereby achieving enhanced repeatability, distinctiveness and localization accuracy.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Notes

  1. 1.

    Interest point detection is run at multiple scales as described in Sect. 3.

  2. 2.

    http://www.vision.ee.ethz.ch/surf/.

  3. 3.

    http://vision.deis.unibo.it/ssalti/Wave.

References

  1. Moravec, H.: Towards automatic visual obstacle avoidance. In: Proceedings of the International Joint Conference on Artificial Intelligence (1977)

    Google Scholar 

  2. Harris, C., Stephens, M.: A combined corner and edge detector. In: Proceedings of the Alvey Vision Conference, pp. 147–151 (1988)

    Google Scholar 

  3. Mikolajczyk, K., Schmid, C.: Scale and affine invariant interest point detectors. Int. J. Comput. Vis. 60, 63–86 (2004)

    Article  Google Scholar 

  4. Shechtman, E., Irani, M.: Matching local self-similarities across images and videos. In: Proceedings of the Conference on Computer Vision and Pattern Recognition (CVPR 2007) (2007)

    Google Scholar 

  5. Huang, J., You, S., Zhao, J.: Multimodal image matching using self similarity. In: Proceedings of the Workshop on Applied Imagery Pattern Recognition (AIPR) (2011)

    Google Scholar 

  6. Maver, J.: Self-similarity and points of interest. Trans. Pattern Anal. Mach. Intell. (PAMI) 32, 1211–1226 (2010)

    Article  Google Scholar 

  7. Buades, A., Coll, B., Morel, J.: A review of image denoising methods, with a new one. Multiscale Model. Simul. 4, 490–530 (2006)

    Article  MathSciNet  Google Scholar 

  8. Dabov, K., Foi, A., Katkovnik, V., Egiazarian, K.: Image denoising by sparse 3d transform-domain collaborative filtering. IEEE Tran. Image Process. 16, 1395–1411 (2007)

    Article  MathSciNet  Google Scholar 

  9. Kadir, T., Brady, M.: Saliency, scale and image description. Int. J. Comput. Vis. 45, 83–105 (2000)

    Article  Google Scholar 

  10. Lowe, D.G.: Distinctive image features from scale-invariant keypoints. Int. J. Comput. Vis. 60, 91–110 (2004)

    Article  Google Scholar 

  11. Matas, J., Chum, O., Urban, M., Pajdla, T.: Robust wide baseline stereo from maximally stable extremal regions. In: Proceedings of the British Machine Vision Conference, BMVC 2002, vol. 1, pp. 384–393 (2002)

    Google Scholar 

  12. Bay, H., Ess, A., Tuytelaars, T., Van Gool, L.: Speeded-up robust features (surf). Comput. Vis. Image Underst. 110, 346–359 (2008)

    Article  Google Scholar 

  13. Goferman, S., Zelnik-Manor, L., Tal, A.: Context-aware saliency detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2010) (2010)

    Google Scholar 

  14. Borji, A., Itti, L.: Exploiting local and global patch rarities for saliency detection. In: Proceedings of the Conference on Computer Vision and Pattern Recognition (CVPR 2012) (2012)

    Google Scholar 

  15. Mc Donnel, M.: Box-filtering techniques. Comput. Graph. Image Process. 17, 65–70 (1981)

    Article  Google Scholar 

  16. Mikolajczyk, K., Tuytelaars, T., Schmid, C., Zisserman, A., Matas, J., Schaffalitzky, F., Kadir, T., Gool, L.V.: A comparison of affine region detectors. Int. J. Comput. Vis. 65, 43–72 (2005)

    Article  Google Scholar 

  17. Salti, S., Lanza, A., Stefano, L.D.: Keypoints from symmetries by wave propagation. In: Proceedings of the International Conference on Computer Vision and Pattern Recognition (2013)

    Google Scholar 

  18. Aanæs, H., Dahl, A.L.: Steenstrup Pedersen, K.: Interesting interest points. Int. J. Comput. Vis. 97, 18–35 (2012)

    Article  Google Scholar 

  19. Hel-Or, Y., Hel-Or, H., David, E.: Fast template matching in non-linear tone-mapped images. In: Proceedings of the International Conference on Computer Vision (ICCV) (2011)

    Google Scholar 

  20. Barnes, C., Shechtman, E., Goldman, D.B., Finkelstein, A.: The generalized PatchMatch correspondence algorithm. In: Daniilidis, K., Maragos, P., Paragios, N. (eds.) ECCV 2010, Part III. LNCS, vol. 6313, pp. 29–43. Springer, Heidelberg (2010)

    Chapter  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Federico Tombari .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2015 Springer International Publishing Switzerland

About this paper

Cite this paper

Tombari, F., Di Stefano, L. (2015). Interest Points via Maximal Self-Dissimilarities. In: Cremers, D., Reid, I., Saito, H., Yang, MH. (eds) Computer Vision -- ACCV 2014. ACCV 2014. Lecture Notes in Computer Science(), vol 9004. Springer, Cham. https://doi.org/10.1007/978-3-319-16808-1_39

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-16808-1_39

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-16807-4

  • Online ISBN: 978-3-319-16808-1

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics