New Methods of Complex Systems Inspection: Comparison of the ADC Device in Different Operating Modes

  • Raoul R. Nigmatullin
  • Yury K. Evdokimov
  • Evgeny S. DenisovEmail author
  • Wei Zhang
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 343)


The authors suggest a general concept for quantitative inspection of complex systems (when the “best fit” model is absent) data in one unified scheme with the help of the sequence of ranged amplitudes (SRA). Moreover, the “up” and “down” branches of SRA distribution can replace a conventional histogram (having uncontrollable errors) and can be expressed in terms of the fitting parameters that are associated with a combination of power-law functions. As an example of a complex system we considered an analog-to-digital convertor having 16 channels. For four compared different operating modes of this device the calculated SRAs have different behavior and the significant quantitative parameters found enable to differentiate all these regimes from each other. We hope that this new approach will find a proper place in analysis of different complex systems and in different engineering applications, where the urgent necessity in quantitative comparison of complex systems without model exists.


Intermediate model Data/signal processing Measurements with/without memory Sequence of the ranged amplitudes 



This paper is stimulated by the R&D project realized in the frame of the JNU-KNRTU(KAI) Joint Laboratory of “Fractal Radio-electronics and Fractal Signal Processing”.


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Copyright information

© Springer International Publishing Switzerland 2015

Authors and Affiliations

  • Raoul R. Nigmatullin
    • 1
  • Yury K. Evdokimov
    • 1
  • Evgeny S. Denisov
    • 1
    Email author
  • Wei Zhang
    • 2
  1. 1.Radioelectronics and Information & Measuring Techniques DepartmentKazan National Research Technical University named after A.N. Tupolev–KAIKazanRussia
  2. 2.Department of Electronic Engineering, College of Information Science and TechnologyJinan University Shi-PaiGuangzhouChina

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