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Simultaneous nc-AFM/STM Measurements with Atomic Resolution

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Noncontact Atomic Force Microscopy

Part of the book series: NanoScience and Technology ((NANO))

Abstract

We discuss the history and recent progress of simultaneous AFM/STM measurements with atomic resolution. We demonstrate, that the technique can provide complex information about chemical and physical processes at atomic scale as well as about material properties of surfaces and nanostructures. We briefly overview one of the most fascinating achievements, high-resolution imaging with functionalized tips. The complexity of this technique calls for a new theoretical approach where relaxation of functionalized probe is considered in both AFM and STM modes. We describe mechanisms responsible for the high-resolution contrast introducing a numerical model, which provides deeper understanding of the AFM/STM measurements.

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Acknowledgments

Our research was performed within the GAČR project no. 14-02079S and EMRP joint research project CRYSTAL. The EMRP is jointly funded  by  the  EMRP participating  countries  within  EURAMET and the European Union. We would like to acknowledge very fruitful discussion with R. Temirov, S. Tautz. R. Pérez, P. Pou, F. Flores, N. Moll, O. Custance, Y. Sugimoto, J. Repp, L. Gross, M. Ternes, F.J. Giessibl, P. Grutter, P. Moriarty and many others.

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  1. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 16200, Prague, Czech Republic

    P. Hapala, M. Ondráček, O. Stetsovych, M. Švec & P. Jelínek

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  1. P. Hapala
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  2. M. Ondráček
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  3. O. Stetsovych
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  4. M. Švec
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Correspondence to P. Jelínek .

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Editors and Affiliations

  1. Institute of Scientific and Industrial Research, Osaka University Nanoscience and Nanotechnology Center, Osaka, Ibaraki, Japan

    Seizo Morita

  2. Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany

    Franz J. Giessibl

  3. Department of Physics, University of Basel, Basel, Switzerland

    Ernst Meyer

  4. ERC Advanced Research Group "FURORE", University of Hamburg, Hamburg, Germany

    Roland Wiesendanger

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Hapala, P., Ondráček, M., Stetsovych, O., Švec, M., Jelínek, P. (2015). Simultaneous nc-AFM/STM Measurements with Atomic Resolution. In: Morita, S., Giessibl, F., Meyer, E., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-15588-3_3

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