Abstract
If the tunnelling junction of a scanning tunnelling microscope (STM) is functionalized with a nanoscale particle, such as a hydrogen or carbon monoxide molecule or a xenon atom, this particle effectively acts as a nanoscale force sensor. It senses forces stemming from the sample and transduces them into a measurable conductance signal. With this hybrid STM/AFM method images can be obtained that reveal the geometric structure of the substrate, very similar to state-of-the-art non-contact dynamic AFM. This chapter provides a survey of experimental results, explains the mechanism, and discusses the prospects of this novel scanning probe method.
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Temirov, R., Tautz, F.S. (2015). Scanning Tunnelling Microscopy with Single Molecule Force Sensors. In: Morita, S., Giessibl, F., Meyer, E., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-15588-3_14
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