Abstract
In this work we present a route to engineer bilayer graphene superlattices via direct nanomanipulation of monolayer graphene sheets by the mean of atomic force microscopy. In order to obtain such structures we manipulate the graphene sheet using an A FM tip in contact mode by scanning it parallel to the edge direction. Since the static surface atomic potential created by the twisted bilayer structure depends on the mismatch angle between the top and bottom layers, we carried out lattice resolution images in order to determine the crystallographic orientation of the graphene and of the folded twisted bilayer.
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Almeida, C.M., Bede, P.M., Fragneaud, B., Achete, C.A. (2014). Engineering graphene superlattices with crystallographic orien-tation control using atomic force microscope. In: Udomkichdecha, W., Böllinghaus, T., Manonukul, A., Lexow, J. (eds) Materials Challenges and Testing for Manufacturing, Mobility, Biomedical Applications and Climate. Springer, Cham. https://doi.org/10.1007/978-3-319-11340-1_1
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DOI: https://doi.org/10.1007/978-3-319-11340-1_1
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