Abstract
Advancement in radio frequency (RF) integrated circuits (ICs) is one of the driving forces behind the wide spread use of modern wireless communication and other high-speed applications. The reliable daily usage of these RF electronics cannot be assured, however, unless the issue of electrostatic discharge (ESD) protection is properly addressed and implemented. As the semiconductor technology continues to scale down, ESD reliability concern is becoming more and more pervasive due to the shrink of device size and reduction of breakdown voltage. In order to mitigate the ESD-induced IC failures, on-chip ESD protection devices are commonly employed to discharge ESD-induced current and to limit the voltages at IC pins to a satisfactorily low level during ESD events.
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© 2015 Springer International Publishing Switzerland
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Cui, Q., Liou, J., Hajjar, JJ., Salcedo, J., Zhou, Y., Parthasarathy, S. (2015). Conclusion. In: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits. Springer, Cham. https://doi.org/10.1007/978-3-319-10819-3_5
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DOI: https://doi.org/10.1007/978-3-319-10819-3_5
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-10818-6
Online ISBN: 978-3-319-10819-3
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