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Mutation-Based Generation of Software Product Line Test Configurations

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Book cover Search-Based Software Engineering (SSBSE 2014)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 8636))

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Abstract

Software Product Lines (SPLs) are families of software products that can be configured and managed through a combination of features. Such products are usually represented with a Feature Model (FM). Testing the entire SPL may not be conceivable due to economical or time constraints and, more simply, because of the large number of potential products. Thus, defining methods for generating test configurations is required, and is now a very active research topic for the testing community. In this context, mutation has recently being advertised as a promising technique. Mutation evaluates the ability of the test suite to detect defective versions of the FM, called mutants. In particular, it has been shown that existing test configurations achieving the mutation criterion correlate with fault detection. Despite the potential benefit of mutation, there is no approach which aims at generating test configurations for SPL with respect to the mutation criterion. In this direction, we introduce a search-based approach which explores the SPL product space to generate product test configurations with the aim of detecting mutants.

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Author information

Authors and Affiliations

  1. Interdisciplinary Centre for Security, Reliability and Trust (SnT), University of Luxembourg, Luxembourg

    Christopher Henard, Mike Papadakis & Yves Le Traon

Authors
  1. Christopher Henard
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  2. Mike Papadakis
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  3. Yves Le Traon
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Editor information

Editors and Affiliations

  1. School of Computer Science, Institute for Software Research, Carnegie Mellon University, 5000 Forbes Avenue, 15213, Pittsburgh, PA, USA

    Claire Le Goues

  2. Department of Computer Scioence, University College London, Gower Street, WC1E 6BT, London, UK

    Shin Yoo

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© 2014 Springer International Publishing Switzerland

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Henard, C., Papadakis, M., Le Traon, Y. (2014). Mutation-Based Generation of Software Product Line Test Configurations. In: Le Goues, C., Yoo, S. (eds) Search-Based Software Engineering. SSBSE 2014. Lecture Notes in Computer Science, vol 8636. Springer, Cham. https://doi.org/10.1007/978-3-319-09940-8_7

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  • DOI: https://doi.org/10.1007/978-3-319-09940-8_7

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-09939-2

  • Online ISBN: 978-3-319-09940-8

  • eBook Packages: Computer ScienceComputer Science (R0)

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