Abstract
Structural analyses of materials are presented using x-ray diffraction techniques. Rietveld method was applied for determining cell parameters.
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Schmal, M., Perez, C.A.C. (2016). Structural Analyses: X-ray Diffraction. In: Heterogeneous Catalysis and its Industrial Applications. Springer, Cham. https://doi.org/10.1007/978-3-319-09250-8_9
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DOI: https://doi.org/10.1007/978-3-319-09250-8_9
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