Abstract
Continuous-wave electron paramagnetic resonance (EPR) spectroscopy has been the technique of choice for the studies of radiation-induced defects in silica (SiO2) for 60 years, and has recently been expanded to include more sophisticated techniques such as high-frequency EPR, pulse electron nuclear double resonance (ENDOR), and pulse electron spin echo envelope modulation (ESEEM) spectroscopy. Structural models of radiation-induced defects obtained from single-crystal EPR analyses of crystalline SiO2 (α-quartz) are often applicable to their respective analogues in amorphous silica (a-SiO2), although significant differences are common.
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Acknowledgments
We thank Drs. David Griscom, Anders Lund and Masaru Shiotani for invitation to participate in this review. YMP and RIM also wish to thank the Natural Science and Engineering Research Council of Canada and the Russian Foundation for Basic Research, respectively, for financial support. AA, SA and GB thank the University of Palermo for financial support and the people of the LAMP group (http://www.fisica.unipa.it/amorphous/)
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Alessi, A., Agnello, S., Buscarino, G., Pan, Y., Mashkovtsev, R. (2014). EPR on Radiation-Induced Defects in SiO2 . In: Lund, A., Shiotani, M. (eds) Applications of EPR in Radiation Research. Springer, Cham. https://doi.org/10.1007/978-3-319-09216-4_7
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