Abstract
Traditional planar bulk or partially depleted SOI (PDSOI) CMOS transistor architectures at present leading edge of miniaturization are plagued by limitations due to unacceptably high current leakages and variability. To cope with these intrinsic limitations there is a need to introduce innovative technologies which take advantage of the benefits of Fully Depleted (FD) devices. There are two main architectures for the undoped channel FD device: 3D FinFETs (SOI or bulk-based) and 2D FDSOI-based transistors. Both of them are being introduced in high volume manufacturing (HVM). A pioneer of SOI concept, silicon on sapphire (SOS) substrates, have recently entered a mainstream radio frequency (RF) application market. Other flavors of engineered substrates, e.g. for photonics or 3D-based applications, have moved from research to industrial development phase. In this work an overview of the recent advances in the development of the engineered substrates for More Moore and More-than-Moore applications will be presented.
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References
Skotnicki, T., Arnaud, F., Faynot, O.: UTBB SOI: a wolf in sheep’s clothing. Fut. Fab Int. 42, 72–79 (2012)
Auth, C., et al.: A 22 nm high performance and low-power CMOS technology featuring fully-depleted tri-gate transistors, self-aligned contacts and high density MIM capacitors. In: Symposium on VLSI Technology. Digest of Technical Papers, pp. 131–132 (2012)
Schwarzenbach, W., Daval, N., Barec, V., Bonnin, O., Acosta-Alba, P., Maddalon, C., Chibko, A., Robson, T., Nguyen, B.Y., Maleville, C.: Atomic scale thickness control of SOI wafers for fully depleted applications. ECS Trans. 53(5), 39–46 (2013)
Schwarzenbach, W., Cauchy, X., Boedt, F., Bonnin, O., Butaud, E., Girard, C.B.-Y., Nguyen, B.Y., Mazure, C., Maleville, C.: Excellent silicon thickness uniformity on ultra-thin SOI for controlling Vt variation of FDSOI. In: IEEE International Conference on ICICDT 2012–Paper B3 (2011)
Besnard, G., Garros, X., Nguyen, P., Andrieu, F., Reynaud, P., Van Den Daele, W., Bourdelle, K.K., Schwarzenbach, W., Reimbold, G., Cristoloveanu, S.: Reliability of ultrathin buried oxides for multi-VT FDSOI technology. In: EuroSOI Conference 2013–Paper 3.3 (2013)
Hashemi, P., et al.: High-performance Si1-xGex channel on insulator tri-gate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions. In: Symposium on VLSI Technology. Digest of Technical Papers–Paper 2.2 (2013)
Brown, A.R., Daval, N., Bourdelle, K.K., Nguyen, B.Y., Asenov, A.: Simulation analysis of process-induced variability in nanoscale SOI and bulk FinFETs. In: IEEE International SOI Conference–Paper 11.4 (2012)
Dobrovolný, P., Zuber, P., Miranda, M., Garcia Bardon, M., Chiarella, T., Buchegger, P., Mercha, K., Verkest, D., Steegen, A., Horiguchi, N.: Impact of fin height variations on SRAM yield. In: Symposium on VLSI-TSA. Digest of Technical Papers–Paper T45 (2012)
Schwarzenbach, W., Daval, N., Kerdilès, S., Chabanne, G., Figuet, C., Guerroudj, S., Bonnin, O., Cauchy, X., Nguyen, B.Y., Maleville, C.: Strained silicon on insulator substrates for fully depleted application. In: IEEE International ICICDT Conference–Paper H3 (2012)
Tiberj, A., Paillard, V., Aulnette, C., Daval, D., Bourdelle, K.K., Moreau, M., Kennard, M., Cayrefourcq, I.: Stress metrology: the challenge for the next generation of engineered wafers. In: Proceedings of Materials Research Society Symposium–Paper B3.1.1, vol. 809 (2004)
Fenouillet-Beranger, C., Perreau, P., Weber, O., Ben-Akkez, I., Cros, A., Bajolet, A., Haendler, S., Fonteneau, P., Gouraud, P., Richard, E., Abbate, F., Barge, D., Pellissier-Tanon, D., Dumont, B., Andrieu, F., Passieux, J., Bon, R., Barral, V., Golanski, D., Petit, D., Planes, N., Bonin, O., Schwarzenbach, W., Poiroux, T., Faynot, O., Haond, M., Boeuf, F.: Enhancement of devices performance of hybrid FDSOI/Bulk technology by using UTBOX sSOI substrates. In: Symposium on VLSI Technology. Digest of Technical Papers, pp. 115–116 (2012)
Allibert, F., Cheng, K., Schwarzenbach, W., Khakifirooz, A., Ecarnot, L., Nguyen, B.Y., Doris, B.: Evaluation of sSOI wafers for 22 nm node and beyond. In: SOI Conference–Paper 7.2 (2012)
Minamisawa, R.A., Süess, M.J., Spolenak, R., Faist, J., David, C., Gobrecht, J., Bourdelle, K.K., Sigg, H.: Top-down fabricated silicon nanowires under tensile elastic strain up to 4.5 %. Nat. Commun. 3, 1096 (2012). doi: 10.1038/ncomms2102
Knoll, L., Zhao, Q.T., Nichau, A., Trellenkamp, S., Richter, S., Schäfer, A., Esseni, D., Selmi, L., Bourdelle, K.K., Mantl, S.: Inverters with strained Si nanowire complementary tunnel field-effect transistors. Electron Device Lett. IEEE 34, 813–815 (2013)
Daval, N., Figuet, C., Aulnette, C., Landru, D., Drazek, C., Bourdelle, K.K., Guiot, E., Letertre, F., Nguyen, B.Y., Mazure, C.: SiGe and Ge on insulator wafers. ECS Trans. 35(5), 29–38 (2011)
Ikeda, K., Kamimuta, Y., Moriyama, Y., Ono, M., Koji, U., Oda, M., Irisawa, T., Furuse, K., Tezuka, T.: Enhancement of hole mobility and cut-off characteristics of strained Ge nanowire pMOSFETs by using plasma oxidized GeOx inter-layer for gate stack. In: Symposium on VLSI Technology. Digest of Technical Papers–Paper 3.3 (2013)
Ivana Subramanian, S., Owen, M.H.S., Tan, K.H., Loke, W.K., Wicaksono, S., Yoon, S.F., Yeo, Y.C.: N-channel InGaAs field-effect transistors formed on Germanium-on-insulator substrates. Appl. Phys. Express 5(116502), 1–3 (2012)
Jalaguier, E., Aspar, B., Pocas, S., Michaud, J.F., Zussy, M., Papon, A.M., Bruel, M.: Transfer of 3in GaAs film on silicon substrate by proton implantation process. Electron. Lett. 34, 408–409 (1998)
Jalaguier, E., Aspar, B., Pocas, S., Michaud, J.F., Papon, A.M., Bruel, M.: Transfer of thin InP films onto silicon substrate by proton implantation process. In: Proceedings of the 11th International Conference on Indium Phosphide and Related Materials, pp. 26–27 (1999)
Di Cioccio, L., Jalaguier, E., Letertre, F.: III–V layer transfer onto silicon and applications. Phys. Status Solidi A 202, 509–515 (2005)
Czornomaz, L., Daix, N., Caimi, D., Sousa, M., Erni, R., Rossell, M.D., El-Kazzi, M., Rossel, C., Marchiori, C., Uccelli, E., Richter, M., Siegwart, H., Fompeyrine, J.: An integration path for gate-first UTB III–V-on-insulator MOSFETs with silicon, using direct wafer bonding and donor wafer recycling. In: Proceedings of the IEEE International Conference on Electron Devices Meeting, IEDM 2012. Technical Digest, pp. 517–520 (2012)
Kim, S.H., Yokoyama, M., Nakane, R., Ichikawa, O., Osada, T., Hata, M., Takenaka, M., Takagi, S.: Strained extremely-thin body In0.53Ga0.47As-on-insulator MOSFETs on Si substrates. In: Symposium on VLSI Technology. Digest of Technical Papers–Paper 5-1 (2013)
Kim, S.H., Yokoyama, M., Nakane, R., Ichikawa, O., Osada, T., Hata, M., Takenaka, M., Takagi, S.: High performance extremely-thin body InAs-on-insulator MOSFETs on Si with Ni-InGaAs metal S/D by contact resistance reduction technology. In: Symposium on VLSI Technology. Digest of Technical Papers–Paper 5-2 (2013)
Imthurn, G.P., Miscione, A.M., Landry, K., Vaufredaz, A., Barge, T., Lagahe-Blanchard, C.: Strain reduction in silicon-on-sapphire by wafer bonding. In: SOI Conference–Paper 6.2 (2011)
Ben Ali, K., Roda Neve, C., Gharsallah, A., Raskin, J.P.: RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer. In: SOI Conference–Paper 9.2 (2012)
Roda Neve, C., Raskin, J.P.: RF harmonic distortion of CPW lines on HR-Si and trap-rich HR-Si substrates. Electron. Devices IEEE Trans. 59, 924–932 (2012)
Roda Neve, C., Ben Ali, K., Malaquin, C., Allibert, F., Desbonnets, E., Bertrand, I., Van Den Daele, W., Raskin, J.P.: RF and linear performance of commercial 200 mm trap-rich HR-SOI wafers for SoC applications. In: Proceedings of the 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems–SiRF’13–Paper MO2B-2 (2013)
Zuffada, M.: The industrialization of the silicon photonics: technology road map and applications. In: 42nd European Solid-State Device Research Conference, ESSDERC 2008, pp. 7–13 (2012)
Akiyama, S., Grawert, F.J., Liu, J., Wada, K., Celler, G.K., Kimerling, L.C., Kaertner, F.X.: Fabrication of highly reflecting epitaxy-ready Si/SiO2 Bragg reflectors. Photonics Technol. Lett. IEEE 17, 1456–1458 (2005)
Sadaka, M., Radu, I., Lagahe-Blanchard, C., Di Cioccio, L.: Stacking™ and smart cut™ technologies for wafer level 3D integration. In: ICICDT Conference–Paper L4 (2012)
Radu, I., Landru, D., Gaudin, G., Riou, G., Tempesta, C., Letertre, F., Di Cioccio, L., Gueguen, P., Signamarcheix, T., Euvrard, C., Dechamp, J., Clavelier, L., Sadaka, M.: Recent developments of Cu-Cu non-thermo compression bonding for wafer-to-wafer 3D stacking. In: Proceedings of the IEEE International Conference on 3D Systems Integration (3DIC) 2010, pp. 1–6 (2010)
Gaudin, G., Riou, G., Landru, D., Tempesta, C., Radu, I., Sadaka, M., Winstel, K., Kinser, E., Hannon, R.: Low temperature direct wafer to wafer bonding for 3D integration: Direct bonding, surface preparation, wafer-to-wafer alignment. In: Proceedings of the IEEE International Conference on 3D Systems Integration (3DIC) 2010, pp. 1–4 (2010)
Di Cioccio, L., Radu, I., Baudin, F., Mounier, A., Lacave, T., Delaye, V., Imbert, B., Chevalier, N., Mariolle, D., Thieffry, S., Mazen, F., Gaudin, G., Signamarcheix, T.: Wafer level 3D stacking using smart cut™ and metal-metal direct bonding technology. ECS Trans. 50(7), 169–175 (2012)
Acknowledgments
Fruitful discussions and advices provided by B.-Y. Nguyen, W. Schwarzenbach, C. Aulnette, N. Daval, O. Bonnin, F. Allibert, L. Ecarnot, P. Nguyen, X. Cauchy, I. Radu, M. Sadaka, E. Desbonnets, C. Cailler, A. Rigny, and many other colleagues at Soitec, CEA-LETI, IMEP-LAHC, and STMicroelectronics are gratefully acknowledged.
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Bourdelle, K.K. (2014). Engineered Substrates for Advanced CMOS Technology Nodes and More-Than-Moore Applications. In: Nazarov, A., Balestra, F., Kilchytska, V., Flandre, D. (eds) Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting. Engineering Materials. Springer, Cham. https://doi.org/10.1007/978-3-319-08804-4_1
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