Skip to main content

Fundamental Noise Limit of an IEPE Accelerometer

  • Chapter
  • First Online:
Piezoelectric Accelerometers with Integral Electronics

Abstract

One of the important advantages of IEPE accelerometers is their small noise permitting them to measure small vibration signals at frequency range from about 0.001 Hz to 20 kHz. Specifically, some modern ultra-low-noise IEPE accelerometers feature a noise floor (equivalent input noise acceleration spectral density) estimated at a few dozen \( \mathrm{ng}/\sqrt{\mathrm{Hz}} \) at frequency 1 Hz and a few \( \mathrm{ng}/\sqrt{\mathrm{Hz}} \) at frequency 100 Hz [1–4]. Designers of IEPE sensors try to decrease their noise more and more. In this matter, the question about the fundamental noise limit of an IEPE accelerometer becomes vital. This chapter describes noise of the PE transducer as the fundamental noise limit of the IEPE accelerometer [5]. Most literature sources on noise of vibration and acoustic sensors describe the mechanical-thermal noise of a damped harmonic oscillator as the only noise source determining the sensor’s noise limit [6–10]. A few other literature sources present the electrical-thermal noise of a piezoelectric (PE) element (crystal) caused by its loss factor as the only noise limit for a PE transducer [11, 12]. But a few, if any, literature sources describe the complete noise analysis of the PE transducer. In this chapter, both noise sources of the PE transducer mentioned above are considered for determination of the fundamental noise limit of the IEPE sensor. The chapter content is based on the author’s work [5].

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 79.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book
USD 139.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Model 86 Seismic Accelerometer (2009) Specification sheet. Meggitt, Endevco. https://www.endevco.com/datasheets/86.pdf

  2. (2009) Seismic accelerometer model 731A, data sheet, rev. C4, Wilcoxon Research, Germantown, MD

    Google Scholar 

  3. Seismic accelerometer model 393B31, data sheet. PCB Piezotronics, Depew, NY. Available online: http://www.pcb.com

  4. Levinzon FA (2012) Ultra-low-noise seismic piezoelectric accelerometer with integral FET amplifier. IEEE Sensor J 12(6):2262–2268

    Article  Google Scholar 

  5. Levinzon FA (2004) Fundamental noise limit of piezoelectric accelerometer. IEEE Sensor J 4(1):108–111

    Article  Google Scholar 

  6. Gabrielson TB (1993) Mechanical-thermal noise in micromachined acoustic and vibration sensosrs. IEEE Trans Elelctron Devices 40:903–909

    Google Scholar 

  7. Boser BE, Howe RT (1996) Surface micromachine accelerometers. IEEE J Solid-State Circuits 31:366–375

    Article  Google Scholar 

  8. Chau H, Wise KD (1987) Noise due to Brownian motion in ultrasensitive solid-state pressure sensors. IEEE Trans Electron Devices ED-24:859–865

    Google Scholar 

  9. Tavakoli M, Sarpeshkar R (2003) An offset-canceling low-noise lock- in architecture for capacitive sensing. IEEE J Solid-State Circuits 38:244–253

    Article  Google Scholar 

  10. Tarnow V (1987) The lower limit of detectable sound pressure. J Acoust Soc Am 82:379–381

    Article  Google Scholar 

  11. Schloss F (1993) Accelerometer noise. Sound and Vibration (March):22–23

    Google Scholar 

  12. Wlodkowski PA, Schloss F (2001), Advances in acoustic particle velocity sensors, Presented at the Workshop Directional Acoustic sensors, Newport, RI, April

    Google Scholar 

  13. Buchanan RC (ed) (1986) Ceramic materials for electronics. Marcel-Dekker, New York

    Google Scholar 

  14. Uchino K, Hirose S (2001) Loss mechanisms in piezoelelctrics: how to measure different losses separately. IEEE Trans Ultrason Ferroelectr Freq Control 48(1):307–321

    Article  Google Scholar 

  15. Kogan S (1996) Electronic noise and fluctuations in solids. Cambridge University Press, Cambridge

    Book  Google Scholar 

  16. (1994) Section 7: N-channel JFETs. In: Low-power discretes data book. Siliconix Inc., Santa Clara, CA, pp 7-1–7-93

    Google Scholar 

  17. (1996) Section B, JFET data sheets. In: Semiconductor databook, Vol 3(4). InterFET Corporation, Garland, TX, pp B1–B70

    Google Scholar 

  18. Levinzon FA, Vandamme LKJ (2011) Comparison of 1/f noise in JFETs and MOSFETs with several figures of merit, fluctuation and noise letters. World Scientific 10(4):447–465

    Google Scholar 

  19. Levinzon FA (2005) Measurement of low-frequency noise of modern low-noise junction field effect transistors. IEEE Trans Instrum Meas 54(6):2427–2432

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 2015 Springer International Publishing Switzerland

About this chapter

Cite this chapter

Levinzon, F. (2015). Fundamental Noise Limit of an IEPE Accelerometer. In: Piezoelectric Accelerometers with Integral Electronics. Springer, Cham. https://doi.org/10.1007/978-3-319-08078-9_6

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-08078-9_6

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-08077-2

  • Online ISBN: 978-3-319-08078-9

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics