Abstract
The forthcoming discussion presents a new method to estimatef Residual stresses using Raman spectroscopy. The method has been validated independently through an existing reliable surface strain measurement technique, known as Digital Image Correlation (DIC). Utilizing phonon deformation potentials for diamond and zinc blende crystal structures, a relationship was first introduced that provides a quantifiable estimate between the Raman peak-shift and residual stresses in confined Silicon Carbide particles. The proposed relationship was further validated independently using classical formulation for thick walled cylinders and DIC techniques. The results obtained show excellent agreement between the measured stresses and the derived relationship between Raman peak-shift and the applied stress.
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© 2015 The Society for Experimental Mechanics, Inc.
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Shafiq, M., Subhash, G. (2015). Determination of Surface Bi-Axial Stresses Using Raman Spectroscopy. In: Jin, H., Sciammarella, C., Yoshida, S., Lamberti, L. (eds) Advancement of Optical Methods in Experimental Mechanics, Volume 3. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-06986-9_18
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DOI: https://doi.org/10.1007/978-3-319-06986-9_18
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