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New Method for Analytical Photovoltaic Parameters Identification: Meeting Manufacturer’s Datasheet for Different Ambient Conditions

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International Congress on Energy Efficiency and Energy Related Materials (ENEFM2013)

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 155))

Abstract

At present, photovoltaic energy is one of the most important renewable energy sources. The demand for solar panels has been continuously growing, both in the industrial electric sector and in the private sector. In both cases the analysis of the solar panel efficiency is extremely important in order to maximize the energy production. In order to have a more efficient photovoltaic system, the most accurate understanding of this system is required. However, in most of the cases the only information available in this matter is reduced, the experimental testing of the photovoltaic device being out of consideration, normally for budget reasons. Several methods, normally based on an equivalent circuit model, have been developed to extract the I-V curve of a photovoltaic device from the small amount of data provided by the manufacturer. The aim of this paper is to present a fast, easy, and accurate analytical method, developed to calculate the equivalent circuit parameters of a solar panel from the only data that manufacturers usually provide. The calculated circuit accurately reproduces the solar panel behavior, that is, the I-V curve. This fact being extremely important for practical reasons such as selecting the best solar panel in the market for a particular purpose, or maximize the energy extraction with MPPT (Maximum Peak Power Tracking) methods.

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Correspondence to Javier Cubas .

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Cubas, J., Pindado, S., de Manuel, C. (2014). New Method for Analytical Photovoltaic Parameters Identification: Meeting Manufacturer’s Datasheet for Different Ambient Conditions. In: Oral, A., Bahsi, Z., Ozer, M. (eds) International Congress on Energy Efficiency and Energy Related Materials (ENEFM2013). Springer Proceedings in Physics, vol 155. Springer, Cham. https://doi.org/10.1007/978-3-319-05521-3_21

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