Abstract
μ-XRF is a relatively new analytical method with a high analytical potential. In between the third instrument generation is available and most of the components have already a high performance. But still there are improvements possible and desirable. Because the application range of the method is very large and still continuously growing special adaptions and improvements of the instrumentation are required. These improvements are possible both for the instrumentation as well as for data evaluation.
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M. Procop, V.D. Hodoroaba, A. Bjeoumikhov, R. Wedell, A. Warrikhoff, X-Ray Spectrom. 38–4, 308 (2009)
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© 2014 Springer International Publishing Switzerland
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Haschke, M. (2014). Prospectives for μ-XRF. In: Laboratory Micro-X-Ray Fluorescence Spectroscopy. Springer Series in Surface Sciences, vol 55. Springer, Cham. https://doi.org/10.1007/978-3-319-04864-2_8
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DOI: https://doi.org/10.1007/978-3-319-04864-2_8
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-04863-5
Online ISBN: 978-3-319-04864-2
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