Effect of Slow Traps on Capacitance–Voltage Measurement

Conference paper
Part of the Environmental Science and Engineering book series (ESE)

Abstract

Charge density inside a two terminal device is probed using two different methods—integration of Capacitance–Voltage characteristic and integration of discharge current following a voltage step. Difference in the two measured values is explained due to presence of slow traps. Simulations are done to validate the proposed explanation.

Keywords

Organic diode Slow traps Impedance spectroscopy 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    ArunTejMallajosyula, S. Sundar Kumar Iyer, BaquerMazhari, Organic Electronics 13, 11581165(2012).Google Scholar
  2. 2.
    Stef an Nowy, Wei Ren, Julia Wagner, Josef A. Web er, and Wolfgang Br ¨utting, Proc. of SPIE Vol. 7415 74150G-1 (2009)Google Scholar
  3. 3.
    Sunghun Lee, Jeong-Hwan Lee, Kwon Hyeon Kim, Seung-Jun Yoo, Tae Gun Kim, Jeong Won Kim, Jang-Joo Kim, Organic Electronics 13 23462351(2012).CrossRefGoogle Scholar
  4. 4.
    Akanksha Sharma, Pramod Kumar, Budhi Singh, Sumita Ray Chaudhuri, and SubhasisGhosh, Appl. Phys. Lett. 99, 023301 (2011). CrossRefGoogle Scholar
  5. 5.
    José M. Montero, Juan Bisquert, Germà Garcia-Belmonte, Eva M. Barea, Henk J. Bolink, Organic Electronics 10, 305312 (2009).Google Scholar
  6. 6.
    L.S.C. Pingree, M.T. Russell, T.J. Marks, M.C. Hersam, Thin Solid Films 515, 47834787(2007).CrossRefGoogle Scholar
  7. 7.
    XinanGuo, Fei Hong, Weipeng Jin, Wen Gu, Hao Zhang, Jun Wang, Organic Electronics 11, 876880(2010).Google Scholar

Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Indian Institute of Technology KanpurKanpurIndia
  2. 2.Samtel Centre for Display TechnologyKanpurIndia

Personalised recommendations