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Physics of Semiconductor Devices pp 869–871Cite as

RETRACTED CHAPTER: An Intense Green Emission From ZnO Nanoparticles Coated with MgO

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Part of the book series: Environmental Science and Engineering ((ENVENG))

Abstract

This paper addresses the effects of annealing temperature on photoluminescence of ZnO nanoparticles coated with MgO. ZnO nanoparticles as well as ZnO coated with MgO showed only a sharp UV emission peak positioned at 396 nm at an annealing temperature of 600 °C. As the annealing temperature increased from 600 to 900 °C, the intensity of green emission enhanced monotonously. The green emission intensity at 900 °C is 18 times higher than its value at 700 °C. But at 1,000 °C, green emission intensity decreased. FT-IR spectra of ZnO@MgO showed that MgO evaporation took place with increase of temperature from 700 to 1,000 °C. These results indicates that intensity of green emission depends on thickness of MgO shell coated over the ZnO nanoparticles.

A retraction to this chapter can be found under DOI 10.1007/978-3-319-03002-9_241

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Authors and Affiliations

  1. Department of Physics, Materials Science Laboratory, National Institute of Technology Warangal, Warangal, 506004, Andhra Pradesh, India

    K. Sowri Babu, A. Ramachandra Reddy & K. Venugopal Reddy

Authors
  1. K. Sowri Babu
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  2. A. Ramachandra Reddy
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  3. K. Venugopal Reddy
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Corresponding author

Correspondence to K. Sowri Babu .

Editor information

Editors and Affiliations

  1. Amity Institute for Advanced Research and Studies (Meterials & Devices), Amity University, Noida, Uttar Pradesh, India

    V. K. Jain

  2. Amity Institute for Advanced Research and Studies (Meterials & Devices), Amity University, Noida, Uttar Pradesh, India

    Abhishek Verma

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© 2014 Springer International Publishing Switzerland

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Sowri Babu, K., Ramachandra Reddy, A., Venugopal Reddy, K. (2014). RETRACTED CHAPTER: An Intense Green Emission From ZnO Nanoparticles Coated with MgO. In: Jain, V., Verma, A. (eds) Physics of Semiconductor Devices. Environmental Science and Engineering(). Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_223

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