Abstract
Zinc oxide (ZnO) thin films were deposited by sol–gel spin coating method on the glass substrate and then the film was annealed at 350, 450, 550 °C for 1 h. Effect of annealing temperature on the structural and optical properties of the film was investigated. Annealed ZnO thin films are polycrystalline with (002) preferential orientation. The information on Crystalline size is obtained from the full width-at half- maximum (FWHM) of the diffraction peaks. The surface morphology of the films was investigated by atomic force microscopy (AFM). Surface roughness was found minimum (8.4 nm) for ZnO sample annealed at 450 °C. The maximum transmittance of 87 % is observed for the film annealed at 450 °C. The optical band gap value decreased and crystalline size increased with increasing the annealing temperatures.
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Kumar, S., Singh, F., Kapoor, A. (2014). Structural and Optical Studies of Sol-Gel Deposited Nanostructured ZnO Thin Films: Annealing Effect. In: Jain, V., Verma, A. (eds) Physics of Semiconductor Devices. Environmental Science and Engineering(). Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_183
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DOI: https://doi.org/10.1007/978-3-319-03002-9_183
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