This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
FEI www.fei.com
Friedli, V., Utke, I.: Optimized molecule supply from nozzle-based gas injection systems for focused electron- and ion-beam induced deposition and etching: simulation and experiment. J. Phys. D. Appl. Phys. 42(12), 125305 (2009)
Castaing, R., Descamps, J.: Sur les bases physiques de l’analyse ponctuelle par spectrographie-X. J.phys. et le Radium. 16(4), 304–317 (1955)
Drouin, D., Couture, A.R., Joly, D., Tastet, X., Aimez, V., Gauvin, R.: CASINO V2.42–A fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users. Scanning 29(3), 92–101 (2007)
Giannuzzi, L.A., Stevie, F.A.: Introduction to focused ion beams, p. 357. Springer Science, Boston (2005)
Langford, R.M., Rogers, M.: In situ lift-out: Steps to improve yield and a comparison with other FIB TEM sample preparation techniques. Micron 39(8), 1325–1330 (2008)
Mayer, J., Giannuzzi, L.A., Kamino, T., Michael, J.: TEM sample preparation and FIB-induced damage. MRS Bull. 32(5), 400–407 (2007)
Young, R.J., Kirk, E.C.G., Williams, D. A., Ahmed, H.: Fabrication of planar and cross-sectional TEM specimens using a focused ion-beam, vol. 199, pp. 205–216. Materials Research Society, Pittsburgh (1990)
De Teresa, J.M., Córdoba, R., Fernández-Pacheco, A., Montero, O., Strichovanec, P., Ibarra, M.R.: Origin of the difference in the resistivity of as-grown focused-ion- and focused-electron-beam-induced Pt nanodeposits. Journal of Nanomaterials 2009, 936863 (2009)
Sangiao, S., Morellon, L., Simon, G., Teresa, J.M.D., Pardo, J.A., Arbiol, J., Ibarra, M.R.: Anomalous hall effect in Fe (001) epitaxial thin films over a wide range in conductivity. Phys. Rev. B (Condensed Matter Mater. Phys.) 79(1), 014431 (2009)
Estradè, S., Rebled, J.M., Arbiol, J., Peiró, F., Infante, I.C., Herranz, G., Sanchez, F., Fontcuberta, J., Córdoba, R., Mendis, B.G., Bleloch, A.L.: Effects of thickness on the cation segregation in epitaxial (001) and (110) La2/3Ca1/3MnO3 thin films. Appl. Phys. Lett. 95(7), 072507 (2009)
Marcano, N., Sangiao, S., Magen, C., Morellon, L., Ibarra, M.R., Plaza, M., Perez, L., De Teresa, J.M.: Role of the surface states in the magnetotransport properties of ultrathin bismuth films. Phys. Rev. B 82(12), 125326 (2010)
Estradè, S., Rebled, J.M., Walls, M.G., de la Pena, F., Colliex, C., Córdoba, R., Infante, I.C., Herranz, G., Sanchez, F., Fontcuberta, J., Peiro, F.: Effect of the capping on the local Mn oxidation state in buried (001) and (110) SrTiO3/La2/3Ca1/3MnO3 interfaces. J. Appl. Phys. 110(10), 103903 (2011)
Lavrijsen, R., Córdoba, R., Schoenaker, F.J., Ellis, T.H., Barcones, B., Kohlhepp, J.T., Swagten, H. J.M., Koopmans, B., De Teresa, J.M., Magén, C., Ibarra, M.R., Trompenaars, P., Mulders, J.J.L.: Fe:O:C grown by focused-electron-beam-induced deposition: magnetic and electric properties. Nanotechnology. 22(2), 025302 (2011)
Córdoba, R., Fernández-Pacheco, R., Fernández-Pacheco, A., Gloter, A., Magén, C., Stephan, O., Ibarra, M.R., De Teresa, J.M.: Nanoscale chemical and structural study of Co-based FEBID structures by STEM-EELS and HRTEM. Nanoscale Res. Lett. 6, 1–6 (2011)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2014 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Córdoba Castillo, R. (2014). Experimental Techniques. In: Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-02081-5_2
Download citation
DOI: https://doi.org/10.1007/978-3-319-02081-5_2
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-02080-8
Online ISBN: 978-3-319-02081-5
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)