Experimental Techniques

  • Rosa Córdoba CastilloEmail author
Part of the Springer Theses book series (Springer Theses)

In this chapter we present the experimental techniques used in the development of this thesis, for the fabrication of samples and for subsequent characterization. The sample fabrication was carried out in three “Dual Beam” (SEM/FIB) systems with similar characteristics: Nova 200 NanoLab and Helios NanoLab 600 stationed in the Advanced Microscopy Laboratory, Institute of Nanoscience of Aragon (INA-LMA), University of Zaragoza, and the Nova 600 NanoLab installed at the Eindhoven University of Technology (TU/e). The characterization of the samples was performed in situ (SEM, EDS, electrical transport measurements) and ex situ (AFM, PPMS, HRTEM, STEM/EELS,…) in the Advanced Microscopy Laboratory, Institute of Nanoscience of Aragon (LMA-INA) and the Physical Measurements Service of the University of Zaragoza.

Nanolithography by “Dual Beam”

Description of a “Dual Beam”

In Chap. 1 we provided an overview of a Dual Beamsystem, detailing the fundamental parts that make it up and its wide...


Electron Energy Loss Spectroscopy Spherical Aberration Precursor Material Physical Property Measurement System Lamella Thickness 
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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Laboratorio de Microscopías Avanzadas-Instituto de Nanociencia de Aragón; Department of Condensed Matter PhysicsUniversidad de ZaragozaZaragozaSpain

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