Double-Pole Four-Throw RF Switch Based on Double-Gate MOSFET
Chapter
First Online:
- 909 Downloads
Abstract
In this chapter, we have designed a double-pole four-throw radio-frequency switch using double-gate (DP4T DG RF) MOSFET to operate at 0.1 GHz to few GHz frequency range for the advanced wireless communication systems. This switch mitigates attenuation of passing signals and exhibits high isolation to avoid misleading of simultaneously received signals. The symmetric DG MOSFET has been the focus of much attention for the application of RF switch due to its ability of strength to short-channel effects and improved current driving capability as discussed in the previous chapters.
Keywords
Phase Noise Insertion Loss Drain Current Return Loss Switching Speed
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
References
- 1.M. Hunter, The basics of radio system design: how to design RF circuits? IEE Training Course, vol. 10, no. 1, p. 17, 2000.Google Scholar
- 2.K. T. Herring, J. W. Holloway, D. H. Staelin, and D. W. Bliss, “Path-loss characteristics of urban wireless channels,” IEEE Trans. on Antennas and Propagation, vol. 58, no. 1, pp. 171-177, Jan. 2010.Google Scholar
- 3.S. Chartier, P. Lohmiller, J. Dederer, H. Schumacher, and M. Oppermann, “SiGe BiCMOS wideband low noise amplifiers for application in digital beam-forming receivers,” Proc. European Microwave Conference, Paris, 28–30 Sept. 2010, pp.1070–1073.Google Scholar
- 4.Q. Jie, J. D. Cali, B. F. Dutton, G. J. Starr, D. Fa Foster, and C. E. Stroud, “Selective spectrum analysis for analog measurements,” IEEE Trans. on Industrial Electronics, vol. 58, no. 10, pp. 4960-4971, Oct. 201.1Google Scholar
- 5.Heng Zhang and Sanchez Sinencio, “Linearization techniques for CMOS low noise amplifiers: A tutorial,” IEEE Trans. on Circuits and Systems, vol. 58, no. 1, pp. 22-36, Jan. 2011.Google Scholar
- 6.M. Emam, P. Sakalas, D. Janvier, J. P. Raskin, L. T. Chuan, and F. Danneville, “Thermal noise in MOSFETs: A two- or a three-parameter noise model?,” IEEE Trans. on Electron Devices, vol. 57, no. 5, pp. 1188-1191, May 2010.Google Scholar
- 7.S. Ickhyun, Jeon Jongwook, Hee Sauk, Kim, Junsoo Park, Byung Gook, Jong Duk Lee, and Hyungcheol Shin, “A simple figure of merit of RF MOSFET for low-noise amplifier design,” IEEE Electron Device Letters, vol. 29, no. 12, pp. 1380–1382, Dec. 2008.Google Scholar
- 8.A. J. Lelis, D. Habersat, R. Green, A. Ogunniyi, M. Gurfinkel, J. Suehle, and N. Goldsman, “Time dependence of bias-stress-induced SiC MOSFET threshold-voltage instability measurements, “ IEEE Trans. on Electron Devices, vol. 55, no. 8, pp. 1835–1840, Aug. 2008.Google Scholar
- 9.Viranjay M. Srivastava, K. S. Yadav, and G. Singh, “Design and performance analysis of double-gate MOSFET over single-gate MOSFET for RF Switch,” Microelectronics Journal, vol. 42, no. 3, pp. 527–534, March 2011.Google Scholar
- 10.A. O. Adan, M. Koyanagi, and M. Fukumi, “Physical model of noise mechanisms in SOI and bulk-silicon MOSFETs for RF applications,” IEEE Trans. on Electron Devices, vol. 55, no. 3, pp. 872–880, March 2008Google Scholar
- 11.Etienne Sicard and Sonia Delmas Bendhia, Basics of CMOS Cell Design, 1st Edition, McGraw-Hill, USA, 2005.Google Scholar
- 12.Sungmo Kang and Yusuf Leblebichi, CMOS Digital Integrated Circuits Analysis and Design, 3rd Edition, McGraw-Hill, New York, USA, 2002.Google Scholar
- 13.A. M. Street, RF Switch Design, IEE Training Course, United Kingdom, vol. 4, pp. 1–7, April 2000.Google Scholar
- 14.Kwangchun Jung and K. O. Kenneth, “A CMOS single-pole four-throw switch,” IEEE Microwave and Wireless Components Letters, vol. 16, no. 3, pp. 128–130, March 2006.Google Scholar
- 15.Yuan Taur, Wei Chen, D. J. Frank, Shih Hsien Lo, and Hon Sum Wong, “CMOS scaling into the nanometer regime,” Proc. of IEEE, vol. 85, no. 4, pp. 486–504, Aug. 2002.Google Scholar
- 16.F. J. Huang and O. Kenneth, “A 0.5 μm CMOS T/R switch for 900 MHz wireless applications,” IEEE J. of Solid State Circuits, vol. 36, no. 3, pp. 486–492, March 2001.Google Scholar
- 17.Usha Gogineni, Hongmei Li, Jesus Alamo, and Susan Sweeney, “Effect of substrate contact shape and placement on RF characteristics of 45 nm low power CMOS devices,” Proc. of Radio Frequency Integrated Circuits Symp., Boston, MA, USA, 7–9 June 2009, pp. 163–166.Google Scholar
- 18.Chien Ta, Efstratios Skafidas, and Robin Evans, “A 60 GHz CMOS transmit/receive switch,” Proc. of IEEE Radio Frequency Integrated Circuits Symp., Honolulu, Hawaii, USA, 3–5 June 2007, pp. 725–728.Google Scholar
- 19.Behzad Razavi, “A 300 GHz fundamental oscillator in 65-nm CMOS technology,” IEEE J. of Solid State Circuits, vol. 46, no. 4, pp. 894–903, April 2011.Google Scholar
- 20.S. Chouksey and J. G. Fossum, “DICE: a beneficial short-channel effect in nanoscale double-gate MOSFETs,” IEEE Trans. on Electron Devices, vol. 55, no. 3, pp. 796–802, March 2008.Google Scholar
- 21.Viranjay M. Srivastava, K. S. Yadav, and G. Singh, “DP4T RF CMOS switch: A better option to replace SPDT switch and DPDT switch,” Recent Patents on Electrical and Electronic Engineering, vol. 5, no. 3, pp. 244–248, Oct. 2012.Google Scholar
- 22.Viranjay M. Srivastava, K. S. Yadav, and G. Singh, “Analysis of Drain Current and Switching Speed for SPDT Switch and DPDT Switch with Proposed DP4T RF CMOS Switch,” J. of Circuits, Systems, and Computers, vol. 21, no. 4, pp. 1–18, June 2012.Google Scholar
- 23.Byung W. Min and Gabriel M. Rebeiz, “A 10 to 50 GHz CMOS distributed step attenuator with low loss and low phase imbalance,” IEEE J. of Solid State Circuits, vol. 42, no. 11, pp. 2547–2554, Nov. 2007.Google Scholar
- 24.Viranjay M. Srivastava, K. S. Yadav, and G. Singh, “Attenuation with double pole four throw CMOS switch design,” Proc. of IEEE Int. Conf. on Semiconductor Electronics, Malaysia, 28–30 June 2010, pp. 173–175,Google Scholar
- 25.K. Raczkowski, S. Thijs, W. De Raedt, B. Nauwelaers, and P. Wambacq, “50 to 67 GHz ESD protected power amplifiers in digital 45 nm LP CMOS,” Proc. of Int. Conf. on Solid State Circuits, San Francisco, California, USA, 8–12 Feb. 2009, pp. 382–384.Google Scholar
- 26.Usha Gogineni, Hongmei Li, Jesus Alamo, Susan Sweeney, and Basanth Jagannathan, “Effect of substrate contact shape and placement on RF characteristics of 45 nm low power CMOS devices,” IEEE J. of Solid State Circuits, vol. 45, no. 5, pp. 998–1006, May 2010.Google Scholar
- 27.A. Valdes Garcia, S. Reynolds, and J. O. Plouchart, “60 GHz transmitter circuits in 65 nm CMOS,” Proc. of Radio Frequency Integrated Circuits Symp., Atlanta, 15–17 June 2008, pp. 641–644.Google Scholar
- 28.Viranjay M. Srivastava, K. S. Yadav, and G. Singh, “ Performance of double-pole four-throw double-gate RF CMOS Switch in 45 nm technology,” Int. J. of Wireless Engineering and Technology, vol. 1, no. 2, pp. 47–54, Oct. 2010.Google Scholar
- 29.S. H. Lee, C. S. Kim, and H. K. Yu, “A small signal RF model and its parameter extraction for substrate effects in RF MOSFETs,” IEEE Trans. on Electron Devices, vol. 48, no. 7, pp. 1374–1379, July 2001.Google Scholar
- 30.G. Chien, F. Weishi, Y. Hsu, and L. Tse, “A 2.4 GHz CMOS transceiver and baseband processor chipset for 802.11b wireless LAN application,” Proc. of IEEE Int. Conf. on Solid State Circuits, San Francisco, 9–13 Feb. 2003, pp. 358–359.Google Scholar
- 31.W. Kluge, L. Dathe, R. Jaehne, and D. Eggert, “A 2.4 GHz CMOS transceiver for 802.11b wireless LANs,” Proc. of IEEE Solid State Circuits Conf., San Francisco, California, USA, 9–13 Feb. 2003, pp. 360–361.Google Scholar
- 32.D. Su, M. Zargari, P. Yue, D. Weber, B. Kaczynski, and B. Wooley, “A 5 GHz CMOS transceiver for IEEE 802.11a wireless LAN systems,” IEEE J. of Solid State Circuits, vol. 37, no. 12, pp. 1688–1694, Dec. 2002.Google Scholar
- 33.D. Su, M. Zargari, P. Yue, D. Weber, B. Kaczynski, and B. Wooley, “A 5 GHz CMOS transceiver for IEEE 802.11a wireless LAN,” Proc. of IEEE Int. Conf. on Solid State Circuits, San Francisco, California, USA, 7 Feb. 2002, pp. 92–93.Google Scholar
- 34.S. Sharma and P. Kumar, “Non overlapped single and double gate SOI/GOI MOSFET for enhanced short channel immunity,” J. of Semiconductor Technology and Science, vol. 9, no. 3, pp. 136–147, Sept. 2009.Google Scholar
- 35.Thomas H. Lee, Planar Microwave Engineering: A Practical Guide to Theory, Measurement and Circuits, 2nd Edition, Cambridge University Press, India, 2006.Google Scholar
- 36.C. Y. Lin, “Design and implementation of configurable ESD protection cell for 60 GHz RF circuits in a 65 nm CMOS process,” Microelectronics Reliability, vol. 51, no. 8, pp. 1315–1324, Aug. 2011.Google Scholar
- 37.J. P. Carmo, P. M. Mendes, C. Couto, and J. H. Correia, “A 2.4 GHz RF CMOS transceiver for wireless sensor applications,” Proc. of Int. Conf. on Electrical Engineering, Coimbra, Portugal, 2005, pp. 902–905.Google Scholar
- 38.P. H. Woerlee, M. J. Knitel, and A. J. Scholten, “RF CMOS performance trends,” IEEE Trans. on Electron Devices, vol. 48, no. 8, pp. 1776–1782, Aug. 2001.Google Scholar
- 39.Viranjay M. Srivastava, K. S. Yadav, and G. Singh, “Analysis of double gate CMOS for double-pole four-throw RF switch design at 45-nm technology,” J. of Computational Electronics, vol. 10, no. 1–2, pp. 229–240, June 2011.Google Scholar
- 40.Y. Cheng and M. Matloubian, “Parameter extraction of accurate and scaleable substrate resistance components in RF MOSFETs,” IEEE Electron Device Letters, vol. 23, no. 4, pp. 221–223, April 2002.Google Scholar
- 41.Li Zhiyuan, Ma Jianguo, Ye Yizheng, and Yu Mingyan, “Compact channel noise models for deep-submicron MOSFETs,” IEEE Trans. on Electron Devices, vol. 56, no. 6, pp. 1300–1308, June 2009.Google Scholar
- 42.A. Poh and Z. Ping, “Design and analysis of transmit/receive switch in triple-well CMOS for MIMO wireless systems,” IEEE Trans. on Microwave Theory and Techniques, vol. 55, no. 3, pp. 458–466, March 2007.Google Scholar
- 43.S. Solda, M. Caruso, A. Bevilacqua, A. Gerosa, D. Vogri, and A. Neviani, “A 5 Mbps UWB-IR transceiver front-end for wireless sensor networks in 0.13 μm CMOS,” IEEE J. of Solid State Circuits, vol. 46, no. 7, pp. 1636–1647, July 2011.Google Scholar
Copyright information
© Springer International Publishing Switzerland 2014