Abstract
X-ray reflectivity (XR) is a powerful tool to probe the atomic structure of surfaces and interfaces.
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Laanait, N. (2013). X-ray Reflectivity Studies of Ion Condensation at the Electrified Liquid/Liquid Interface. In: Ion Correlations at Electrified Soft Matter Interfaces. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-00900-1_4
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