Abstract
Atomic force microscopy in solution offers a platform for assessing interactions on chemically modified surfaces. In this study a biologically relevant molecule, an amino acid, is adsorbed onto a compositionally varied semiconductor substrate. AFM is used to assess the effect of the substrate composition on the adhesion of the amino acid. We report adsorption of L-arginine to an indium-gallium-nitride (InGaN) substrate with a gradient of In:Ga composition. Data are collected above and below the isoelectric point of arginine to highlight the effect of protonation on the adhesive behavior across the InGaN. Characterization is also performed using X-ray photoelectron spectroscopy to establish the presence of amino acid on the surface and determine the general composition of a given region of the substrate both with and without amino acid. Combining these factors, we are able to better evaluate the significance of substrate properties in influencing the behavior of surface molecules. Determining the dynamics of amino acid behavior as a function of both the substrate and the environment provides new insight into the preparation of semiconductor materials for biological applications.
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References
Davis RF (1991) III-V nitrides for electronic and optoelectronic applications. Proc IEEE 79(5):702–712
Ponce FA, Bour DP (1997) Nitride-based semiconductors for blue and green light-emitting devices. Nature 386:351–359
Jewett SA, Makowski MS, Andrews B, Manfra MJ, Ivanisevic A (2012) Gallium nitride is biocompatible and non-toxic before and after functionalization with peptides. Acta Biomater 8:728–733
Gupta S, Elias M, Wen X, Shapiro J, Brillson L, Lu W, Lee SC (2008) Detection of clinically relevant levels of protein analyte under physiologic buffer using planar field effect transistors. Biosens Bioelectron 24(4):505–511
Chin VWL, Tansley TL, Osotchan T (1994) Electron mobilities in gallium indium, and aluminum nitrides. J Appl Phys 75(11):7365–7372
Kuykendall T, Ulrich P, Aloni S, Yang P (2007) Complete composition tenability of InGaN nanowires using a combinatorial approach. Nat Mater 6:951–956
Cimalla I, Will F, Tonisch K, Niebelschütz M, Cimalla V, Lebedev V, Kittler G, Himmerlich M, Krischok S, Schaefer JA, Gebinoga M, Schober A, Friedrich T, Ambacher O (2007) AlGaN/GaN biosensor – effect of device processing steps on the surface properties and biocompatibility. Sens Actuators B 123:740–748
Chaniotakis N, Sofikiti N (2008) Novel semiconductor materials for the development of chemical sensors and biosensors: a review. Anal Chim Acta 615:1–9
Slavin JWJ, Jarori U, Zemlyanov D, Ivanisevic A (2009) Characterization of amino acid adlayers on InAs surfaces using X-ray photoelectron spectroscopy. J Electron Spectrosc Relat Phenom 172:47–53
Slavin JWJ, Zemlyanov D, Ivanisevic A (2009) Adsorption of amino acids on indium arsenide (100) surfaces: assessment of passivation capabilities. Surf Sci 603:907–911
Makowski MS, Ivanisevic A (2001) Molecular analysis of blood with micro-/nanoscale field-effect-transistor biosensors. Small 7(14):1863–1875
César M, Ke Y, Ji W, Guo H, Mi Z (2011) Band gap of InxGa1−xN: a first principles analysis. Appl Phys Lett 98:202107–202109
Chen Z, Su LW, Shi JY, Wang XL, Tang CL, Gao P (2012) AFM application in III-nitride materials and devices. In Bellitto V (ed) Atomic force microscopy – imaging, measuring, and manipulating surfaces at the atomic scale. InTech, pp 189–208
Goede K, Grundmann M, Holland-Nell K, Beck-Sickinger AG (2006) Cluster properties of peptides on (100) semiconductor surfaces. Langmuir 22:8104–8108
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© 2014 The Society for Experimental Mechanics
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Bain, L.E., Hosalli, A.M., Bedair, S.M., Paskova, T., Ivanisevic, A. (2014). Molecular Interactions on InxGa1−xN. In: Shaw III, G., Prorok, B., Starman, L., Furlong, C. (eds) MEMS and Nanotechnology, Volume 5. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-00780-9_14
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DOI: https://doi.org/10.1007/978-3-319-00780-9_14
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