Abstract
This chapter gives an overview of the most popular methods for measurement of particle size and shape. It covers microscopy and image analysis, laser diffraction, dynamic light scattering and gravitational and centrifugal sedimentation. In view of its capability for measurements at high particulate concentrations, the ultrasound attenuation technique is also included. Moreover, measurement techniques for porosity, surface area and pore size distributions and zeta potential are examined. This chapter also contains sections on sampling and dispersion of dry powders, since either of the two often limits the accuracy of the measured data.
Particle size analysis is not an objective in itself,
it is a means to an end,
i.e. the application of such knowledge to
some manufacturing process or performance of some product.
H. Heywood [13].
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Notes
- 1.
The second subscript value of the D represents its weighting: 0 for number, 1 for length, 2 for area and 3 for volume [ISO 9276].
- 2.
Note that NIST uses the word ‘monodisperse system’ for a collection of particles for which at least 90 % lies within a range of 5 % of the median size, and ‘polydisperse system’ for a particle collection, where more than 10 % differs at least 5 % from the median size [25].
- 3.
A new instrument measures Brownian motion of suspended particles directly, through microscopic inspection after illumination by a focused laser beam.
- 4.
Also an aerosol centrifuge has existed for separation of aerosol particles according to size.
- 5.
Note that the boundary layer represents a real distance but is conceptual, since the surface of shear varies slightly with time because there is a rapid exchange of adsorbed species and those in the dispersion medium. Thus, the surface of shear and the boundary layer have a statistical nature. This is the reason for the term ‘statistical thickness of double layer’.
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Merkus, H.G. (2014). Measurement of Particle Size, Shape, Porosity and Zeta-potential. In: Merkus, H., Meesters, G. (eds) Particulate Products. Particle Technology Series, vol 19. Springer, Cham. https://doi.org/10.1007/978-3-319-00714-4_3
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