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Ion Temperature and Cross-relaxation Effects on OFI Soft-X-Ray Laser

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X-Ray Lasers 2012

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 147))

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Abstract

We present a theoretical investigation on the influence of ion temperature with cross-relaxation (CR) effects upon a collisionally pumped, optical-field-ionized (OFI) soft-X-ray laser (SXRL). Our results indicate that ion heating can induce a significant modification of the SXRL energy. However, whereas the CR rate is large in an OFI plasma, its contribution on the SXRL energy is found to be small.

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References

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Correspondence to G. Maynard .

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Boudaa, A., Maynard, G., Cros, B. (2014). Ion Temperature and Cross-relaxation Effects on OFI Soft-X-Ray Laser. In: Sebban, S., Gautier, J., Ros, D., Zeitoun, P. (eds) X-Ray Lasers 2012. Springer Proceedings in Physics, vol 147. Springer, Cham. https://doi.org/10.1007/978-3-319-00696-3_8

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