Abstract
For the development of the pODMR studies outlined in Chaps. 3 and 4, it is important to fully understand the technical nature of the experiments performed. To this end, a detailed overview of several of the salient experimental issues is discussed in this section. First a walk-through of the technical setup is given, which outlines some of the more critical features of physically implementing these experiments. Also critical to any measurement is the knowledge of how a dynamic signal becomes digitized, which then determines how those data are later analyzed. A description of how the resonantly transient response in photoluminescence is captured and digitized is given, enabling a meaningful scaling of data that are acquired with the Bruker Elexsys E580. Calibration of this spectrometer’s input analog-to-digital converter (ADC) is also crucial for scaling data correctly, and is also discussed. Finally, since the ODMR observable is a resonant change in photoluminescence intensity, it is imperative that the researcher have complete knowledge of the emitting species which are supported by the material under investigation. To this end, the need for spectral selection of the desired emission band is demonstrated with an example given of the confusion which can result from incomplete knowledge of a material’s minority emission channels.
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Notes
- 1.
Bruker BioSpin Corp.; Billerica, MA, USA; X-band EPR spectrometer.
- 2.
Bruker BioSpin Corp.; Billerica, MA, USA; ER 4118X-MD5 X-band resonator.
- 3.
Bruker BioSpin Corp.; Billerica, MA, USA; ER 4118CF 4He cryostat.
- 4.
Bruker BioSpin Corp.; Billerica, MA, USA; E4118130 FlexLine Sample Rod.
- 5.
Thorlabs, Inc.; Newton, NJ, USA; excitation fiber:BFH22-550; collection fibers: BFL22-365.
- 6.
Wilmad-LabGlass; Vineland, NJ, USA; part number: 707-SQ-250M.
- 7.
Bruker BioSpin Corp.; Billerica, MA, USA; E4118140 Sample Holder Set.
- 8.
Coherent, Inc.; Santa Clara, CA, USA; Innova 90-4 Laser System, supplied by Laser Innovations, Santa Paula, CA, USA.
- 9.
Semrock, Inc.; Rochester, NY, USA; 459.9 nm MaxLine, part number:LL01-458-12.5.
- 10.
Coherent, Inc.; Santa Clara, CA, USA; FieldMaxII with diode sensitivity range of 400–1,060 nm.
- 11.
Thorlabs, Inc.; Newton, NJ, USA; part number: NDC-50C-2M.
- 12.
Thorlabs, Inc.; Newton, NJ, USA; part number: F220SMA-A.
- 13.
Semrock, Inc.; Rochester, NY, USA; 458 nm RazorEdge filter, part number:LP02-458RU-25.
- 14.
FEMTO Messtechnik GmbH; Berlin, Germany; Si Photoreceiver, part number: LCA-S-400K-SI.
- 15.
Stanford Research Systems, Inc.; Sunnyvale, CA, USA; SR560 Low Noise Preamplifier.
- 16.
Applied Systems Engineering, Inc.; Fort Worth, TX, USA; Model 117 1kW X-band amplifier.
- 17.
Andor Technology PLC; Belfast, Ireland; Imaging spectrometer with UV-Vis mirror and 150 l/mm (1.57 nm resolution) ruled grating.
- 18.
Andor Technology PLC; Belfast, Ireland; with 18 mm generation 3 intensifier tube.
- 19.
CryLas GmbH; Berlin, Germany; Diode pumped passively Q-switched solid state laser, model FTSS 355-50.
- 20.
Sigma-Aldrich; USA; polystyrene, purity > 99. 99%.
- 21.
M. Braun, Inc.; Stratham, NJ, USA; custom configuration.
- 22.
Carolina Biological Supply; Burlington, NC, USA; 1 cm square, 0.2 mm thick.
- 23.
R.G. Hansen&Associates; Santa Barbara, CA, USA; closed-cycle He cryostat model: DE-202.
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van Schooten, K. (2013). Experimental Methods. In: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance. Springer Theses. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00590-4_2
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