Abstract
In summary, post-silicon validation becomes a vital step in the design flow of VLSI circuits. Although many ad-hoc solutions have been proposed in practice, the validation difficulty from escalating complexity and inaccurate model motivates the need for automatic and algorithmic solutions. In this book, we investigate several key research problems in this area. The proposed algorithmic solutions together with new introduced DfD hardware provide an important contribution on the automatic techniques in post-silicon validation.
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© 2014 Springer International Publishing Switzerland
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Liu, X., Xu, Q. (2014). Conclusion. In: Trace-Based Post-Silicon Validation for VLSI Circuits. Lecture Notes in Electrical Engineering, vol 252. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00533-1_9
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DOI: https://doi.org/10.1007/978-3-319-00533-1_9
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Publisher Name: Springer, Heidelberg
Print ISBN: 978-3-319-00532-4
Online ISBN: 978-3-319-00533-1
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