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Critical Sensitivity and Trans-scale Fluctuations in Catastrophic Rupture

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Earthquake Processes: Physical Modelling, Numerical Simulation and Data Analysis Part II

Part of the book series: Pageoph Topical Volumes ((PTV))

Abstract

Rupture in the heterogeneous crust appears to be a catastrophe transition. Catastrophic rupture sensitively depends on the details of heterogeneity and stress transfer on multiple scales. These are difficult to identify and deal with. As a result, the threshold of earthquake-like rupture presents uncertainty. This may be the root of the difficulty of earthquake prediction. Based on a coupled pattern mapping model, we represent critical sensitivity and trans-scale fluctuations associated with catastrophic rupture. Critical sensitivity means that a system may become significantly sensitive near catastrophe transition. Trans-scale fluctuations mean that the level of stress fluctuations increases strongly and the spatial scale of stress and damage fluctuations evolves from the mesoscopic heterogeneity scale to the macroscopic scale as the catastrophe regime is approached. The underlying mechanism behind critical sensitivity and trans-scale fluctuations is the coupling effect between heterogeneity and dynamical nonlinearity. Such features may provide clues for prediction of catastrophic rupture, like material failure and great earthquakes. Critical sensitivity may be the physical mechanism underlying a promising earthquake forecasting method, the load-unload response ratio (LURR).

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Author information

Authors and Affiliations

  1. State Key Laboratory of Nonlinear Mechanics (LNM), Institute of Mechanics, Chinese Academy of Sciences, Beijing, 100080, China

    Meng Fen Xia, Yu Jie Wei, Fu Jiu Ke & Yi Long Bai

  2. Department of Physics, Peking University, Beijing, 100871, China

    Meng Fen Xia

  3. Department of Applied Physics, Beijing University of Aeronautics and Astronautics, Beijing, 100083, China

    Fu Jiu Ke

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  1. Meng Fen Xia
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  2. Yu Jie Wei
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  3. Fu Jiu Ke
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  4. Yi Long Bai
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Editor information

Editors and Affiliations

  1. University of Tokyo, Bunkyo-Ku, Tokyo, 113-0033, Japan

    Mitsuhiro Matsu’ura

  2. QUAKES, Dep. Of Earth Sciences, University of Queensland, Brisbane, Qld, 4072, Australia

    Peter Mora

  3. Jet Propulsion Laboratory, NASA, 4800 Oak Grove Drive, Pasadena, CA, 91109-8099, USA

    Andrea Donnellan

  4. China Academy of Sciences, Laboratory of Nonlinear Mechanics, Institute of Mechanics, Beijing, 100080, China

    Xiang-chu Yin

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© 2002 Springer Basel AG

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Xia, M.F., Wei, Y.J., Ke, F.J., Bai, Y.L. (2002). Critical Sensitivity and Trans-scale Fluctuations in Catastrophic Rupture. In: Matsu’ura, M., Mora, P., Donnellan, A., Yin, Xc. (eds) Earthquake Processes: Physical Modelling, Numerical Simulation and Data Analysis Part II. Pageoph Topical Volumes. Birkhäuser, Basel. https://doi.org/10.1007/978-3-0348-8197-5_16

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  • DOI: https://doi.org/10.1007/978-3-0348-8197-5_16

  • Publisher Name: Birkhäuser, Basel

  • Print ISBN: 978-3-7643-6916-3

  • Online ISBN: 978-3-0348-8197-5

  • eBook Packages: Springer Book Archive

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