Abstract
An overview of the problem of go/no-go testing for parametric faults in analog integrated circuits is given. In a linear model that includes both test stimulus and measurement errors, the influence of such errors on the test decision is analyzed in order to calculate trade-off curves for the probabilities of misclassification. This is achieved by an optimization of the correlation between test and performance.
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© 2003 Springer Basel AG
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Pronath, M., Graeb, H., Antreich, K. (2003). On Parametric Test Design for Analog Integrated Circuits considering Error in Measurement and Stimulus. In: Antreich, K., Bulirsch, R., Gilg, A., Rentrop, P. (eds) Modeling, Simulation, and Optimization of Integrated Circuits. ISNM International Series of Numerical Mathematics, vol 146. Birkhäuser, Basel. https://doi.org/10.1007/978-3-0348-8065-7_18
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DOI: https://doi.org/10.1007/978-3-0348-8065-7_18
Publisher Name: Birkhäuser, Basel
Print ISBN: 978-3-0348-9426-5
Online ISBN: 978-3-0348-8065-7
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