Abstract
The Support Vector Data Description (\(\text {L}_1\) SVDD) is a non-parametric one-class classification algorithm that utilizes the \(\text {L}_1\) norm in its objective function. An alternative formulation of SVDD, called \(\text {L}_2\) SVDD, uses a \(\text {L}_2\) norm in its objective function and has not been extensively studied. \(\text {L}_1\) SVDD and \(\text {L}_2\) SVDD are formulated as distinct quadratic programming (QP) problems and can be solved with a QP-solver. The \(\text {L}_2\) SVDD and \(\text {L}_1\) SVDD’s ability to detect small and large shifts in data generated from multivariate normal, multivariate t, and multivariate Laplace distributions is evaluated. Similar comparisons are made using real-world datasets taken from various applications including oncology, activity recognition, marine biology, and agriculture. In both the simulated and real-world examples, \(\text {L}_2\) SVDD and \(\text {L}_1\) SVDD perform similarly, though, in some cases, one outperforms the other. We propose an extension of the SMO algorithm for \(\text {L}_2\) SVDD, and we compare the runtimes of four algorithms: \(\text {L}_2\) SVDD (SMO), \(\text {L}_2\) SVDD (QP), \(\text {L}_1\) SVDD (SMO), and \(\text {L}_1\) SVDD (QP). The runtimes favor \(\text {L}_1\) SVDD (QP) versus \(\text {L}_2\) SVDD (QP), sometimes substantially; however using SMO reduces the difference in runtimes considerably, making \(\text {L}_2\) SVDD (SMO) feasible for practical applications. We also present gradient descent and stochastic gradient descent algorithms for linear versions of both the \(\text {L}_1\) SVDD and \(\text {L}_2\) SVDD. Examples using simulated and real-world data show that both methods perform similarly. Finally, we apply the \(\text {L}_1\) SVDD and \(\text {L}_2\) SVDD to a real-world dataset that involves monitoring machine failures in a manufacturing process.
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Maboudou-Tchao, E.M., Harrison, C.W. (2022). A Comparative Study of \(\text {L}_1\) and \(\text {L}_2\) Norms in Support Vector Data Descriptions. In: Tran, K.P. (eds) Control Charts and Machine Learning for Anomaly Detection in Manufacturing. Springer Series in Reliability Engineering. Springer, Cham. https://doi.org/10.1007/978-3-030-83819-5_9
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DOI: https://doi.org/10.1007/978-3-030-83819-5_9
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